Proton-induced radiation damage in germanium detectors
High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process, several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10/sup...
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| Veröffentlicht in: | IEEE transactions on nuclear science 1991-04, Vol.38 (2), p.209-217 |
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| creator | Bruckner, J. Korfer, M. Wanke, H. Schroeder, A.N.F. Filges, D. Dragovitsch, P. Englert, P.A.J. Starr, R. Trombka, J.I. Taylor, I. Drake, D.M. Shunk, E.R. |
| description | High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process, several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10/sup 8/ protons cm/sup -2/ (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific and engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation, all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage, the detectors were stepwise-annealed at temperatures of T |
| doi_str_mv | 10.1109/23.289298 |
| format | Article |
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To simulate this process, several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10/sup 8/ protons cm/sup -2/ (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific and engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation, all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage, the detectors were stepwise-annealed at temperatures of T<or=110 degrees C while kept in their specially designed cryostats. The authors show that n-type HPGe detectors can be used in charged-particle environments as high-energy resolution devices until a certain level of radiation damage is accumulated and that the damage can be removed at moderate annealing temperatures and the detector returned to operating condition.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/23.289298</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>Legacy CDMS: IEEE</publisher><subject>440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems ; ANNEALING ; BARYONS ; ELEMENTARY PARTICLES ; Energy measurement ; Exact sciences and technology ; FERMIONS ; Gamma ray detection ; Gamma ray detectors ; GE SEMICONDUCTOR DETECTORS ; Germanium ; HADRONS ; HEAT TREATMENTS ; HIGH-PURITY GE DETECTORS ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; IRRADIATION ; MEASURING INSTRUMENTS ; NUCLEONS ; Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Particle measurements ; Physics ; PROTONS ; RADIATION DETECTORS ; RADIATION EFFECTS ; RESOLUTION ; SEMICONDUCTOR DETECTORS ; Shape ; SPACE FLIGHT ; Space missions ; Spacecraft Instrumentation ; Temperature</subject><ispartof>IEEE transactions on nuclear science, 1991-04, Vol.38 (2), p.209-217</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-3e3816a7726c5c31e088bbffa92b3217e0a005ffe84d1f13e1f52b190520f9cd3</citedby><cites>FETCH-LOGICAL-c385t-3e3816a7726c5c31e088bbffa92b3217e0a005ffe84d1f13e1f52b190520f9cd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/289298$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,792,881,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/289298$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5437851$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5090247$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Bruckner, J.</creatorcontrib><creatorcontrib>Korfer, M.</creatorcontrib><creatorcontrib>Wanke, H.</creatorcontrib><creatorcontrib>Schroeder, A.N.F.</creatorcontrib><creatorcontrib>Filges, D.</creatorcontrib><creatorcontrib>Dragovitsch, P.</creatorcontrib><creatorcontrib>Englert, P.A.J.</creatorcontrib><creatorcontrib>Starr, R.</creatorcontrib><creatorcontrib>Trombka, J.I.</creatorcontrib><creatorcontrib>Taylor, I.</creatorcontrib><creatorcontrib>Drake, D.M.</creatorcontrib><creatorcontrib>Shunk, E.R.</creatorcontrib><title>Proton-induced radiation damage in germanium detectors</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process, several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10/sup 8/ protons cm/sup -2/ (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific and engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation, all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage, the detectors were stepwise-annealed at temperatures of T<or=110 degrees C while kept in their specially designed cryostats. The authors show that n-type HPGe detectors can be used in charged-particle environments as high-energy resolution devices until a certain level of radiation damage is accumulated and that the damage can be removed at moderate annealing temperatures and the detector returned to operating condition.</description><subject>440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems</subject><subject>ANNEALING</subject><subject>BARYONS</subject><subject>ELEMENTARY PARTICLES</subject><subject>Energy measurement</subject><subject>Exact sciences and technology</subject><subject>FERMIONS</subject><subject>Gamma ray detection</subject><subject>Gamma ray detectors</subject><subject>GE SEMICONDUCTOR DETECTORS</subject><subject>Germanium</subject><subject>HADRONS</subject><subject>HEAT TREATMENTS</subject><subject>HIGH-PURITY GE DETECTORS</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>IRRADIATION</subject><subject>MEASURING INSTRUMENTS</subject><subject>NUCLEONS</subject><subject>Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Particle measurements</subject><subject>Physics</subject><subject>PROTONS</subject><subject>RADIATION DETECTORS</subject><subject>RADIATION EFFECTS</subject><subject>RESOLUTION</subject><subject>SEMICONDUCTOR DETECTORS</subject><subject>Shape</subject><subject>SPACE FLIGHT</subject><subject>Space missions</subject><subject>Spacecraft Instrumentation</subject><subject>Temperature</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><sourceid>CYI</sourceid><recordid>eNqFkL1LBDEQxYMoeJ4WtmKxiAgWe2aSzW5SivgFghZah1x2opHbRJO9wv_eHHvYWg3D-817M0PIMdAFAFVXjC-YVEzJHTIDIWQNopO7ZEYpyFo1Su2Tg5w_S9sIKmakfUlxjKH2oV9b7Ktkem9GH0PVm8G8Y-VD9Y5pMMGvh6rHEe0YUz4ke86sMh5t65y83d2-3jzUT8_3jzfXT7XlUow1Ry6hNV3HWissB6RSLpfOGcWWnEGH1FAqnEPZ9OCAIzjBlqCoYNQp2_M5OZt8Yx69ztaX_A8bQyhraEEVZU1XoIsJ-krxe4151IPPFlcrEzCus2ZScGhZ-z8oeHEUtICXE2hTzDmh01_JDyb9aKB682fNuJ7-XNjzranJ1qxcMsH6_DcgGt5JAQU7nbBgstFhTFmDUlDOL_LG5WSSPSL-DW8jfgHqHYtb</recordid><startdate>19910401</startdate><enddate>19910401</enddate><creator>Bruckner, J.</creator><creator>Korfer, M.</creator><creator>Wanke, H.</creator><creator>Schroeder, A.N.F.</creator><creator>Filges, D.</creator><creator>Dragovitsch, P.</creator><creator>Englert, P.A.J.</creator><creator>Starr, R.</creator><creator>Trombka, J.I.</creator><creator>Taylor, I.</creator><creator>Drake, D.M.</creator><creator>Shunk, E.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>CYE</scope><scope>CYI</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7U5</scope><scope>OTOTI</scope></search><sort><creationdate>19910401</creationdate><title>Proton-induced radiation damage in germanium detectors</title><author>Bruckner, J. ; Korfer, M. ; Wanke, H. ; Schroeder, A.N.F. ; Filges, D. ; Dragovitsch, P. ; Englert, P.A.J. ; Starr, R. ; Trombka, J.I. ; Taylor, I. ; Drake, D.M. ; Shunk, E.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-3e3816a7726c5c31e088bbffa92b3217e0a005ffe84d1f13e1f52b190520f9cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems</topic><topic>ANNEALING</topic><topic>BARYONS</topic><topic>ELEMENTARY PARTICLES</topic><topic>Energy measurement</topic><topic>Exact sciences and technology</topic><topic>FERMIONS</topic><topic>Gamma ray detection</topic><topic>Gamma ray detectors</topic><topic>GE SEMICONDUCTOR DETECTORS</topic><topic>Germanium</topic><topic>HADRONS</topic><topic>HEAT TREATMENTS</topic><topic>HIGH-PURITY GE DETECTORS</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>IRRADIATION</topic><topic>MEASURING INSTRUMENTS</topic><topic>NUCLEONS</topic><topic>Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Particle measurements</topic><topic>Physics</topic><topic>PROTONS</topic><topic>RADIATION DETECTORS</topic><topic>RADIATION EFFECTS</topic><topic>RESOLUTION</topic><topic>SEMICONDUCTOR DETECTORS</topic><topic>Shape</topic><topic>SPACE FLIGHT</topic><topic>Space missions</topic><topic>Spacecraft Instrumentation</topic><topic>Temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bruckner, J.</creatorcontrib><creatorcontrib>Korfer, M.</creatorcontrib><creatorcontrib>Wanke, H.</creatorcontrib><creatorcontrib>Schroeder, A.N.F.</creatorcontrib><creatorcontrib>Filges, D.</creatorcontrib><creatorcontrib>Dragovitsch, P.</creatorcontrib><creatorcontrib>Englert, P.A.J.</creatorcontrib><creatorcontrib>Starr, R.</creatorcontrib><creatorcontrib>Trombka, J.I.</creatorcontrib><creatorcontrib>Taylor, I.</creatorcontrib><creatorcontrib>Drake, D.M.</creatorcontrib><creatorcontrib>Shunk, E.R.</creatorcontrib><collection>NASA Scientific and Technical Information</collection><collection>NASA Technical Reports Server</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>OSTI.GOV</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bruckner, J.</au><au>Korfer, M.</au><au>Wanke, H.</au><au>Schroeder, A.N.F.</au><au>Filges, D.</au><au>Dragovitsch, P.</au><au>Englert, P.A.J.</au><au>Starr, R.</au><au>Trombka, J.I.</au><au>Taylor, I.</au><au>Drake, D.M.</au><au>Shunk, E.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Proton-induced radiation damage in germanium detectors</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>1991-04-01</date><risdate>1991</risdate><volume>38</volume><issue>2</issue><spage>209</spage><epage>217</epage><pages>209-217</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process, several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10/sup 8/ protons cm/sup -2/ (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific and engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation, all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage, the detectors were stepwise-annealed at temperatures of T<or=110 degrees C while kept in their specially designed cryostats. The authors show that n-type HPGe detectors can be used in charged-particle environments as high-energy resolution devices until a certain level of radiation damage is accumulated and that the damage can be removed at moderate annealing temperatures and the detector returned to operating condition.</abstract><cop>Legacy CDMS</cop><pub>IEEE</pub><doi>10.1109/23.289298</doi><tpages>9</tpages></addata></record> |
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| identifier | ISSN: 0018-9499 |
| ispartof | IEEE transactions on nuclear science, 1991-04, Vol.38 (2), p.209-217 |
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| subjects | 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems ANNEALING BARYONS ELEMENTARY PARTICLES Energy measurement Exact sciences and technology FERMIONS Gamma ray detection Gamma ray detectors GE SEMICONDUCTOR DETECTORS Germanium HADRONS HEAT TREATMENTS HIGH-PURITY GE DETECTORS INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Instruments, apparatus, components and techniques common to several branches of physics and astronomy IRRADIATION MEASURING INSTRUMENTS NUCLEONS Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy Particle measurements Physics PROTONS RADIATION DETECTORS RADIATION EFFECTS RESOLUTION SEMICONDUCTOR DETECTORS Shape SPACE FLIGHT Space missions Spacecraft Instrumentation Temperature |
| title | Proton-induced radiation damage in germanium detectors |
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