A new method for determination of single-sideband noise figure
A new method for determining mathematically the single-sideband noise figure of a device from double-sideband measurements is presented. The need for tunable filters as in other single-sideband measurement systems has been eliminated, and hence this method greatly reduces the complexity and cost of...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1994-12, Vol.42 (12), p.2435-2439 |
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| container_end_page | 2439 |
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| container_issue | 12 |
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| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 42 |
| creator | Collins, C.E. Pollard, R.D. Miles, R.E. Dildine, R.G. |
| description | A new method for determining mathematically the single-sideband noise figure of a device from double-sideband measurements is presented. The need for tunable filters as in other single-sideband measurement systems has been eliminated, and hence this method greatly reduces the complexity and cost of performing accurate noise figure measurements. Compared to conventional methods, more noise power measurements are required during both the calibration and measurement stages. These are combined in such a way as to cancel out the unwanted sidebands and are subsequently corrected for mismatch errors. Results obtained at various frequencies for both active and passive test devices with frequency-dependent noise figures are presented and compared to the expected values and the equivalent double-sideband measurements.< > |
| doi_str_mv | 10.1109/22.339778 |
| format | Article |
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The need for tunable filters as in other single-sideband measurement systems has been eliminated, and hence this method greatly reduces the complexity and cost of performing accurate noise figure measurements. Compared to conventional methods, more noise power measurements are required during both the calibration and measurement stages. These are combined in such a way as to cancel out the unwanted sidebands and are subsequently corrected for mismatch errors. 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The need for tunable filters as in other single-sideband measurement systems has been eliminated, and hence this method greatly reduces the complexity and cost of performing accurate noise figure measurements. Compared to conventional methods, more noise power measurements are required during both the calibration and measurement stages. These are combined in such a way as to cancel out the unwanted sidebands and are subsequently corrected for mismatch errors. Results obtained at various frequencies for both active and passive test devices with frequency-dependent noise figures are presented and compared to the expected values and the equivalent double-sideband measurements.< ></description><subject>Applied sciences</subject><subject>Calibration</subject><subject>Circuit properties</subject><subject>Costs</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Error correction</subject><subject>Exact sciences and technology</subject><subject>Filters</subject><subject>Frequency</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Noise cancellation</subject><subject>Noise figure</subject><subject>Noise measurement</subject><subject>Performance evaluation</subject><subject>Power measurement</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1994</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LxDAQhoMouK4evHrKQQQPXfPRNMlFWBa_YMGLnkuaTtZIm6xJF_Hfb6WLnoZhnvdheBG6pGRBKdF3jC0411KqIzSjQshCV5IcoxkhVBW6VOQUneX8Oa6lIGqG7pc4wDfuYfiILXYx4RYGSL0PZvAx4Ohw9mHTQZF9C40JLQ7RZ8DOb3YJztGJM12Gi8Oco_fHh7fVc7F-fXpZLdeFZYwOhROECje-xShApR0TDdOMVFaWlOqKCA7cqLayrRK6bRpLmlKBk0yVxjBO-RzdTN5til87yEPd-2yh60yAuMv1CEpZcjKCtxNoU8w5gau3yfcm_dSU1L8N1YzVU0Mje32QmmxN55IJ1ue_AC85J0SP2NWEeQD4v06OPQLia-4</recordid><startdate>19941201</startdate><enddate>19941201</enddate><creator>Collins, C.E.</creator><creator>Pollard, R.D.</creator><creator>Miles, R.E.</creator><creator>Dildine, R.G.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19941201</creationdate><title>A new method for determination of single-sideband noise figure</title><author>Collins, C.E. ; Pollard, R.D. ; Miles, R.E. ; Dildine, R.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c221t-f5015f97721ee69f25b29206c741196053e3a8d6cd859dbbc0b48ef7284aa2313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Applied sciences</topic><topic>Calibration</topic><topic>Circuit properties</topic><topic>Costs</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Error correction</topic><topic>Exact sciences and technology</topic><topic>Filters</topic><topic>Frequency</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Noise cancellation</topic><topic>Noise figure</topic><topic>Noise measurement</topic><topic>Performance evaluation</topic><topic>Power measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Collins, C.E.</creatorcontrib><creatorcontrib>Pollard, R.D.</creatorcontrib><creatorcontrib>Miles, R.E.</creatorcontrib><creatorcontrib>Dildine, R.G.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Collins, C.E.</au><au>Pollard, R.D.</au><au>Miles, R.E.</au><au>Dildine, R.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A new method for determination of single-sideband noise figure</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1994-12-01</date><risdate>1994</risdate><volume>42</volume><issue>12</issue><spage>2435</spage><epage>2439</epage><pages>2435-2439</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A new method for determining mathematically the single-sideband noise figure of a device from double-sideband measurements is presented. The need for tunable filters as in other single-sideband measurement systems has been eliminated, and hence this method greatly reduces the complexity and cost of performing accurate noise figure measurements. Compared to conventional methods, more noise power measurements are required during both the calibration and measurement stages. These are combined in such a way as to cancel out the unwanted sidebands and are subsequently corrected for mismatch errors. Results obtained at various frequencies for both active and passive test devices with frequency-dependent noise figures are presented and compared to the expected values and the equivalent double-sideband measurements.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/22.339778</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0018-9480 |
| ispartof | IEEE transactions on microwave theory and techniques, 1994-12, Vol.42 (12), p.2435-2439 |
| issn | 0018-9480 1557-9670 |
| language | eng |
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| source | IEEE Xplore |
| subjects | Applied sciences Calibration Circuit properties Costs Electric, optical and optoelectronic circuits Electronics Error correction Exact sciences and technology Filters Frequency Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Noise cancellation Noise figure Noise measurement Performance evaluation Power measurement |
| title | A new method for determination of single-sideband noise figure |
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