Characterization of triggered vacuum switches for high current operation
Triggered vacuum switches show promise for use in high-power, high-current and high-frequency conversion and switching circuits. Their specific power and power density ratings are well above silicon devices. TVS are robust devices that can survive faults that would destroy other types of switching d...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on magnetics 1999-01, Vol.35 (1), p.367-371 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 371 |
---|---|
container_issue | 1 |
container_start_page | 367 |
container_title | IEEE transactions on magnetics |
container_volume | 35 |
creator | Pappas, J.A. Pish, S.P. Salinas, M.J. |
description | Triggered vacuum switches show promise for use in high-power, high-current and high-frequency conversion and switching circuits. Their specific power and power density ratings are well above silicon devices. TVS are robust devices that can survive faults that would destroy other types of switching devices. In addition, TVS are capable of fast recovery. However, there is not much performance data at high current and frequency and TVS are unable to recover reliably under reversing current and voltage conditions after passing a peak current greater than 20 kA. This paper describes the results of tests performed to obtain a wide variety of characteristics, including V/I characteristic, ability to share current, and ability to recover when a reverse voltage is applied. |
doi_str_mv | 10.1109/20.738433 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_20_738433</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>738433</ieee_id><sourcerecordid>26861763</sourcerecordid><originalsourceid>FETCH-LOGICAL-c404t-e9610ddaa8a92a6843cf0602948baa2a68416467c53f170d8ecc0a10ee0350083</originalsourceid><addsrcrecordid>eNqFkDFPwzAQhS0EEqUwsDJ5QCCGlHPiOPaIKqBIlVhgjg7n0hilTbETEPx60qaCDabT3X3v6e4xdipgIgSY6xgmWaJlkuyxkTBSRADK7LMRgNCRkUoesqMQXvtWpgJGbDat0KNtybsvbF2z4k3JW-8WC_JU8He0Xbfk4cO1tqLAy8bzyi0qbjvvadXyZk1-qztmByXWgU52dcye726fprNo_nj_ML2ZR1aCbCMySkBRIGo0Mar-UluCgthI_YK4nQglVWbTpBQZFJqsBRRABEkKoJMxuxx817556yi0-dIFS3WNK2q6kBthjOhfy3ry4k8y1jFkRiT_g0orkakNeDWA1jcheCrztXdL9J-5gHwTfx5DPsTfs-c7UwwW69LjyrrwK1CZkanpsbMBc0T0s915fAPrl4t-</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26861763</pqid></control><display><type>article</type><title>Characterization of triggered vacuum switches for high current operation</title><source>IEEE/IET Electronic Library (IEL)</source><creator>Pappas, J.A. ; Pish, S.P. ; Salinas, M.J.</creator><creatorcontrib>Pappas, J.A. ; Pish, S.P. ; Salinas, M.J.</creatorcontrib><description>Triggered vacuum switches show promise for use in high-power, high-current and high-frequency conversion and switching circuits. Their specific power and power density ratings are well above silicon devices. TVS are robust devices that can survive faults that would destroy other types of switching devices. In addition, TVS are capable of fast recovery. However, there is not much performance data at high current and frequency and TVS are unable to recover reliably under reversing current and voltage conditions after passing a peak current greater than 20 kA. This paper describes the results of tests performed to obtain a wide variety of characteristics, including V/I characteristic, ability to share current, and ability to recover when a reverse voltage is applied.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.738433</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit faults ; Circuit testing ; Conversion ; Density ; Devices ; Electric potential ; Electrical engineering. Electrical power engineering ; Exact sciences and technology ; Frequency ; High current ; High voltage or high current generators ; High-current and high-voltage technology: power systems; power transmission lines and cables (including superconducting cables) ; Inductors ; Performance evaluation ; Robustness ; Silicon devices ; Switches ; Switching circuits ; Vacuum switches ; Various equipment and components ; Voltage ; Zero voltage switching</subject><ispartof>IEEE transactions on magnetics, 1999-01, Vol.35 (1), p.367-371</ispartof><rights>1999 INIST-CNRS</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c404t-e9610ddaa8a92a6843cf0602948baa2a68416467c53f170d8ecc0a10ee0350083</citedby><cites>FETCH-LOGICAL-c404t-e9610ddaa8a92a6843cf0602948baa2a68416467c53f170d8ecc0a10ee0350083</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/738433$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,796,4040,4041,23921,23922,25131,27915,27916,54749</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/738433$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1679459$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Pappas, J.A.</creatorcontrib><creatorcontrib>Pish, S.P.</creatorcontrib><creatorcontrib>Salinas, M.J.</creatorcontrib><title>Characterization of triggered vacuum switches for high current operation</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>Triggered vacuum switches show promise for use in high-power, high-current and high-frequency conversion and switching circuits. Their specific power and power density ratings are well above silicon devices. TVS are robust devices that can survive faults that would destroy other types of switching devices. In addition, TVS are capable of fast recovery. However, there is not much performance data at high current and frequency and TVS are unable to recover reliably under reversing current and voltage conditions after passing a peak current greater than 20 kA. This paper describes the results of tests performed to obtain a wide variety of characteristics, including V/I characteristic, ability to share current, and ability to recover when a reverse voltage is applied.</description><subject>Applied sciences</subject><subject>Circuit faults</subject><subject>Circuit testing</subject><subject>Conversion</subject><subject>Density</subject><subject>Devices</subject><subject>Electric potential</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>High current</subject><subject>High voltage or high current generators</subject><subject>High-current and high-voltage technology: power systems; power transmission lines and cables (including superconducting cables)</subject><subject>Inductors</subject><subject>Performance evaluation</subject><subject>Robustness</subject><subject>Silicon devices</subject><subject>Switches</subject><subject>Switching circuits</subject><subject>Vacuum switches</subject><subject>Various equipment and components</subject><subject>Voltage</subject><subject>Zero voltage switching</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkDFPwzAQhS0EEqUwsDJ5QCCGlHPiOPaIKqBIlVhgjg7n0hilTbETEPx60qaCDabT3X3v6e4xdipgIgSY6xgmWaJlkuyxkTBSRADK7LMRgNCRkUoesqMQXvtWpgJGbDat0KNtybsvbF2z4k3JW-8WC_JU8He0Xbfk4cO1tqLAy8bzyi0qbjvvadXyZk1-qztmByXWgU52dcye726fprNo_nj_ML2ZR1aCbCMySkBRIGo0Mar-UluCgthI_YK4nQglVWbTpBQZFJqsBRRABEkKoJMxuxx817556yi0-dIFS3WNK2q6kBthjOhfy3ry4k8y1jFkRiT_g0orkakNeDWA1jcheCrztXdL9J-5gHwTfx5DPsTfs-c7UwwW69LjyrrwK1CZkanpsbMBc0T0s915fAPrl4t-</recordid><startdate>199901</startdate><enddate>199901</enddate><creator>Pappas, J.A.</creator><creator>Pish, S.P.</creator><creator>Salinas, M.J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7U5</scope><scope>8BQ</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>199901</creationdate><title>Characterization of triggered vacuum switches for high current operation</title><author>Pappas, J.A. ; Pish, S.P. ; Salinas, M.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c404t-e9610ddaa8a92a6843cf0602948baa2a68416467c53f170d8ecc0a10ee0350083</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Applied sciences</topic><topic>Circuit faults</topic><topic>Circuit testing</topic><topic>Conversion</topic><topic>Density</topic><topic>Devices</topic><topic>Electric potential</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>High current</topic><topic>High voltage or high current generators</topic><topic>High-current and high-voltage technology: power systems; power transmission lines and cables (including superconducting cables)</topic><topic>Inductors</topic><topic>Performance evaluation</topic><topic>Robustness</topic><topic>Silicon devices</topic><topic>Switches</topic><topic>Switching circuits</topic><topic>Vacuum switches</topic><topic>Various equipment and components</topic><topic>Voltage</topic><topic>Zero voltage switching</topic><toplevel>online_resources</toplevel><creatorcontrib>Pappas, J.A.</creatorcontrib><creatorcontrib>Pish, S.P.</creatorcontrib><creatorcontrib>Salinas, M.J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pappas, J.A.</au><au>Pish, S.P.</au><au>Salinas, M.J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of triggered vacuum switches for high current operation</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1999-01</date><risdate>1999</risdate><volume>35</volume><issue>1</issue><spage>367</spage><epage>371</epage><pages>367-371</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Triggered vacuum switches show promise for use in high-power, high-current and high-frequency conversion and switching circuits. Their specific power and power density ratings are well above silicon devices. TVS are robust devices that can survive faults that would destroy other types of switching devices. In addition, TVS are capable of fast recovery. However, there is not much performance data at high current and frequency and TVS are unable to recover reliably under reversing current and voltage conditions after passing a peak current greater than 20 kA. This paper describes the results of tests performed to obtain a wide variety of characteristics, including V/I characteristic, ability to share current, and ability to recover when a reverse voltage is applied.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.738433</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9464 |
ispartof | IEEE transactions on magnetics, 1999-01, Vol.35 (1), p.367-371 |
issn | 0018-9464 1941-0069 |
language | eng |
recordid | cdi_crossref_primary_10_1109_20_738433 |
source | IEEE/IET Electronic Library (IEL) |
subjects | Applied sciences Circuit faults Circuit testing Conversion Density Devices Electric potential Electrical engineering. Electrical power engineering Exact sciences and technology Frequency High current High voltage or high current generators High-current and high-voltage technology: power systems power transmission lines and cables (including superconducting cables) Inductors Performance evaluation Robustness Silicon devices Switches Switching circuits Vacuum switches Various equipment and components Voltage Zero voltage switching |
title | Characterization of triggered vacuum switches for high current operation |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T18%3A08%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characterization%20of%20triggered%20vacuum%20switches%20for%20high%20current%20operation&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=Pappas,%20J.A.&rft.date=1999-01&rft.volume=35&rft.issue=1&rft.spage=367&rft.epage=371&rft.pages=367-371&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/20.738433&rft_dat=%3Cproquest_RIE%3E26861763%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26861763&rft_id=info:pmid/&rft_ieee_id=738433&rfr_iscdi=true |