Analysis of 3-D magnetic fields measured using a magnetic force scanning tunneling microscope

The deflections of the probe tip of a magnetic force scanning tunneling microscope are calculated for 3-D magnetic fields. The magnetic fields are calculated for a thin film whose magnetization is uniform through the thickness of the film and can be expressed by Fourier series in the other two dimen...

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Veröffentlicht in:	IEEE transactions on magnetics 1994-11, Vol.30 (6), p.4488-4490
Hauptverfasser:	Burke, E.R., Gomez, R.D., Mayergoyz, I.D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Force measurement Fourier series Magnetic analysis Magnetic field measurement Magnetic films Magnetic force microscopy Magnetic forces Magnetic tunneling Magnetization Probes
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