Effect of additive dither on the resolution of ADC's with single-bit or multibit errors
The topic of this paper is to investigate the effects of additive dither on nonideal ADC's, i.e., ADC's with nonlinearity errors. To that end, the nonideal ADC transfer characteristics are considered as a superposition of the ideal characteristics plus nonlinearity errors. First, the facto...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1996-04, Vol.45 (2), p.610-615 |
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Sprache: | eng |
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