On the design and generation of the double exponential function
For the double exponential function f(t)=K(e/sup -at/-e/sup -bt/), which is used for impulse testing of electrical components and systems, we derive an approximate relation between the ratio y/sub m/=T/sub m//T/sub max/, where T/sub max/ and T/sub m/ are, respectively, the times to reach the peak va...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1996-02, Vol.45 (1), p.309-312 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Dutta Roy, S.C. Bhargava, D.K. |
| description | For the double exponential function f(t)=K(e/sup -at/-e/sup -bt/), which is used for impulse testing of electrical components and systems, we derive an approximate relation between the ratio y/sub m/=T/sub m//T/sub max/, where T/sub max/ and T/sub m/ are, respectively, the times to reach the peak value F/sub max/ and the value F/sub max//m on the tail of the pulse, and the ratio x=b/a. This relation is useful for finding x for a prescribed y/sub m/, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. We also present a number of RC two-ports for generating the test function f(t) from an impulse function /spl delta/(t), as well as from the step function u(t). |
| doi_str_mv | 10.1109/19.481355 |
| format | Article |
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This relation is useful for finding x for a prescribed y/sub m/, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. We also present a number of RC two-ports for generating the test function f(t) from an impulse function /spl delta/(t), as well as from the step function u(t).</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.481355</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Electromagnetic transients ; Electronics ; EMP radiation effects ; Equations ; Exact sciences and technology ; Impulse testing ; Joining processes ; Lightning ; System testing ; Tail ; Testing, measurement, noise and reliability</subject><ispartof>IEEE transactions on instrumentation and measurement, 1996-02, Vol.45 (1), p.309-312</ispartof><rights>1996 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c235t-50c3521c90e2703ff711400b70f2874031578b227a3bbae520ed51ab51dff3853</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/481355$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/481355$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2979518$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Dutta Roy, S.C.</creatorcontrib><creatorcontrib>Bhargava, D.K.</creatorcontrib><title>On the design and generation of the double exponential function</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>For the double exponential function f(t)=K(e/sup -at/-e/sup -bt/), which is used for impulse testing of electrical components and systems, we derive an approximate relation between the ratio y/sub m/=T/sub m//T/sub max/, where T/sub max/ and T/sub m/ are, respectively, the times to reach the peak value F/sub max/ and the value F/sub max//m on the tail of the pulse, and the ratio x=b/a. This relation is useful for finding x for a prescribed y/sub m/, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. 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This relation is useful for finding x for a prescribed y/sub m/, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. We also present a number of RC two-ports for generating the test function f(t) from an impulse function /spl delta/(t), as well as from the step function u(t).</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.481355</doi><tpages>4</tpages></addata></record> |
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| issn | 0018-9456 1557-9662 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Electromagnetic transients Electronics EMP radiation effects Equations Exact sciences and technology Impulse testing Joining processes Lightning System testing Tail Testing, measurement, noise and reliability |
| title | On the design and generation of the double exponential function |
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