AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS
A mathematical analysis of the time-dependent multi-dimensional Hydrodynamic model is performed to determine the well-posed boundary conditions for semiconductor device simulation. The number of independent boundary conditions that need to be specified at electrical contacts of a semi-conductor devi...
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Veröffentlicht in: | Compel 1995-09, Vol.14 (2/3), p.157-185 |
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creator | ALURU, N.R. LAW, K.H. PINSKY, P.M. DUTTON, R.W. |
description | A mathematical analysis of the time-dependent multi-dimensional Hydrodynamic model is performed to determine the well-posed boundary conditions for semiconductor device simulation. The number of independent boundary conditions that need to be specified at electrical contacts of a semi-conductor device are derived. Using the classical energy method, a mathematical relation among the physical parameters is established to define the well-posed boundary conditions for the problem. Several possible sets of boundary conditions are given to illustrate the proper boundary conditions. Natural boundary conditions that can be specified are obtained from the boundary integrals of the weak-form finite element formulations. An example is included to illustrate the importance of well-posedness of the boundary conditions for device simulation. |
doi_str_mv | 10.1108/eb010145 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1108_eb010145</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>160013111</sourcerecordid><originalsourceid>FETCH-LOGICAL-c452t-ede79f78b21758f2ff95afc93c44549f3048f48ca6cd5f291e03f73a200a7d113</originalsourceid><addsrcrecordid>eNpl0F1r2zAUBmBRVmiWFfoTRHux3bjTp2VderbTeDg2xElLrlTFliBt0mRWAu2_r7L0A1JdSAgevefoAHCB0TXGKPpt5ggjzPgJ6BHEWcBDFH4DPUQpCXDI5Bn47twD8kty1AP3cQnjMi5mdV7DagAnwwwOZ-m4SmdlPMoTWGd-r8p0mkyqMUyz2zzJ4KhKswIG8E81LdN4PIN7kU_yqqx9WgrrfDQt4v_3H-DU6qUz529nH0wH2SQZBkV1kydxETSMk21gWiOkFdGcYMEjS6yVXNtG0oYxzqSliEWWRY0Om5ZbIrFB1AqqCUJatBjTPvh5yN10638747ZqtXCNWS71k1nvnBKMUsr9BLy8PJIP61335JtTBMkoEpITj34dUNOtneuMVZtusdLdi8JI7Qet3gftaXCgC7c1zx9Od48qFFRwxe6ICj39O-Q3at_p1cGblen0sv148Z6oNq39_M-x-lL_FXlJjWk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>209887952</pqid></control><display><type>article</type><title>AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS</title><source>Emerald A-Z Current Journals</source><creator>ALURU, N.R. ; LAW, K.H. ; PINSKY, P.M. ; DUTTON, R.W.</creator><creatorcontrib>ALURU, N.R. ; LAW, K.H. ; PINSKY, P.M. ; DUTTON, R.W.</creatorcontrib><description>A mathematical analysis of the time-dependent multi-dimensional Hydrodynamic model is performed to determine the well-posed boundary conditions for semiconductor device simulation. The number of independent boundary conditions that need to be specified at electrical contacts of a semi-conductor device are derived. Using the classical energy method, a mathematical relation among the physical parameters is established to define the well-posed boundary conditions for the problem. Several possible sets of boundary conditions are given to illustrate the proper boundary conditions. Natural boundary conditions that can be specified are obtained from the boundary integrals of the weak-form finite element formulations. An example is included to illustrate the importance of well-posedness of the boundary conditions for device simulation.</description><identifier>ISSN: 0332-1649</identifier><identifier>EISSN: 2054-5606</identifier><identifier>DOI: 10.1108/eb010145</identifier><identifier>CODEN: CODUDU</identifier><language>eng</language><publisher>Bradford: MCB UP Ltd</publisher><subject>Boundary conditions ; Boundary value problems ; Fluid dynamics ; Integrated circuits ; Mathematical analysis ; Navier-Stokes equations ; Partial differential equations ; Semiconductors ; Simulation ; Studies</subject><ispartof>Compel, 1995-09, Vol.14 (2/3), p.157-185</ispartof><rights>MCB UP Limited</rights><rights>Copyright MCB UP Limited (MCB) Sep 1995</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c452t-ede79f78b21758f2ff95afc93c44549f3048f48ca6cd5f291e03f73a200a7d113</citedby><cites>FETCH-LOGICAL-c452t-ede79f78b21758f2ff95afc93c44549f3048f48ca6cd5f291e03f73a200a7d113</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/eb010145/full/pdf$$EPDF$$P50$$Gemerald$$H</linktopdf><linktohtml>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/eb010145/full/html$$EHTML$$P50$$Gemerald$$H</linktohtml><link.rule.ids>314,780,784,967,11635,27924,27925,52686,52689</link.rule.ids></links><search><creatorcontrib>ALURU, N.R.</creatorcontrib><creatorcontrib>LAW, K.H.</creatorcontrib><creatorcontrib>PINSKY, P.M.</creatorcontrib><creatorcontrib>DUTTON, R.W.</creatorcontrib><title>AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS</title><title>Compel</title><description>A mathematical analysis of the time-dependent multi-dimensional Hydrodynamic model is performed to determine the well-posed boundary conditions for semiconductor device simulation. The number of independent boundary conditions that need to be specified at electrical contacts of a semi-conductor device are derived. Using the classical energy method, a mathematical relation among the physical parameters is established to define the well-posed boundary conditions for the problem. Several possible sets of boundary conditions are given to illustrate the proper boundary conditions. Natural boundary conditions that can be specified are obtained from the boundary integrals of the weak-form finite element formulations. An example is included to illustrate the importance of well-posedness of the boundary conditions for device simulation.</description><subject>Boundary conditions</subject><subject>Boundary value problems</subject><subject>Fluid dynamics</subject><subject>Integrated circuits</subject><subject>Mathematical analysis</subject><subject>Navier-Stokes equations</subject><subject>Partial differential equations</subject><subject>Semiconductors</subject><subject>Simulation</subject><subject>Studies</subject><issn>0332-1649</issn><issn>2054-5606</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNpl0F1r2zAUBmBRVmiWFfoTRHux3bjTp2VderbTeDg2xElLrlTFliBt0mRWAu2_r7L0A1JdSAgevefoAHCB0TXGKPpt5ggjzPgJ6BHEWcBDFH4DPUQpCXDI5Bn47twD8kty1AP3cQnjMi5mdV7DagAnwwwOZ-m4SmdlPMoTWGd-r8p0mkyqMUyz2zzJ4KhKswIG8E81LdN4PIN7kU_yqqx9WgrrfDQt4v_3H-DU6qUz529nH0wH2SQZBkV1kydxETSMk21gWiOkFdGcYMEjS6yVXNtG0oYxzqSliEWWRY0Om5ZbIrFB1AqqCUJatBjTPvh5yN10638747ZqtXCNWS71k1nvnBKMUsr9BLy8PJIP61335JtTBMkoEpITj34dUNOtneuMVZtusdLdi8JI7Qet3gftaXCgC7c1zx9Od48qFFRwxe6ICj39O-Q3at_p1cGblen0sv148Z6oNq39_M-x-lL_FXlJjWk</recordid><startdate>19950901</startdate><enddate>19950901</enddate><creator>ALURU, N.R.</creator><creator>LAW, K.H.</creator><creator>PINSKY, P.M.</creator><creator>DUTTON, R.W.</creator><general>MCB UP Ltd</general><general>Emerald Group Publishing Limited</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>0U~</scope><scope>1-H</scope><scope>7SC</scope><scope>7SP</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>8AO</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L.0</scope><scope>L6V</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>19950901</creationdate><title>AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS</title><author>ALURU, N.R. ; LAW, K.H. ; PINSKY, P.M. ; DUTTON, R.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c452t-ede79f78b21758f2ff95afc93c44549f3048f48ca6cd5f291e03f73a200a7d113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Boundary conditions</topic><topic>Boundary value problems</topic><topic>Fluid dynamics</topic><topic>Integrated circuits</topic><topic>Mathematical analysis</topic><topic>Navier-Stokes equations</topic><topic>Partial differential equations</topic><topic>Semiconductors</topic><topic>Simulation</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ALURU, N.R.</creatorcontrib><creatorcontrib>LAW, K.H.</creatorcontrib><creatorcontrib>PINSKY, P.M.</creatorcontrib><creatorcontrib>DUTTON, R.W.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Global News & ABI/Inform Professional</collection><collection>Trade PRO</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ProQuest Pharma Collection</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ABI/INFORM Professional Standard</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Compel</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ALURU, N.R.</au><au>LAW, K.H.</au><au>PINSKY, P.M.</au><au>DUTTON, R.W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS</atitle><jtitle>Compel</jtitle><date>1995-09-01</date><risdate>1995</risdate><volume>14</volume><issue>2/3</issue><spage>157</spage><epage>185</epage><pages>157-185</pages><issn>0332-1649</issn><eissn>2054-5606</eissn><coden>CODUDU</coden><abstract>A mathematical analysis of the time-dependent multi-dimensional Hydrodynamic model is performed to determine the well-posed boundary conditions for semiconductor device simulation. The number of independent boundary conditions that need to be specified at electrical contacts of a semi-conductor device are derived. Using the classical energy method, a mathematical relation among the physical parameters is established to define the well-posed boundary conditions for the problem. Several possible sets of boundary conditions are given to illustrate the proper boundary conditions. Natural boundary conditions that can be specified are obtained from the boundary integrals of the weak-form finite element formulations. An example is included to illustrate the importance of well-posedness of the boundary conditions for device simulation.</abstract><cop>Bradford</cop><pub>MCB UP Ltd</pub><doi>10.1108/eb010145</doi><tpages>29</tpages></addata></record> |
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subjects | Boundary conditions Boundary value problems Fluid dynamics Integrated circuits Mathematical analysis Navier-Stokes equations Partial differential equations Semiconductors Simulation Studies |
title | AN ANALYSIS OF THE HYDRODYNAMIC SEMICONDUCTOR DEVICE MODEL - BOUNDARY CONDITIONS AND SIMULATIONS |
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