Edge tail length effect on reliability of DBC substrates under thermal cycling
Purpose - Direct-bond-copper (DBC) substrates crack after about 15 thermal cycles from −55 to 250°C. The purpose of this paper is to study the phenomenology of thermal-cracking to determine the suitability of DBC for high-temperature packaging.Design methodology approach - The thermal plastic strain...
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description | Purpose - Direct-bond-copper (DBC) substrates crack after about 15 thermal cycles from −55 to 250°C. The purpose of this paper is to study the phenomenology of thermal-cracking to determine the suitability of DBC for high-temperature packaging.Design methodology approach - The thermal plastic strain distribution at the edge of the DBC substrate was analyzed by using a finite element method with the Chaboche model for copper. The parameters of the Chaboche model were verified by comparing with the three-point bending test results of DBC substrate. The thermal analyses involving different edge tail lengths indicated that susceptibility to cracking was influenced by the edge geometry of the DBC substrate.Findings - Interface cracking was observed to initiate at the short edge of the bonded copper and propagated into the ceramic layer. The interface crack was caused by the accumulation of thermal plastic strain near the short edge. The edge tail can decrease the thermal strain along the short edge of the DBC substrate. Thermal cycling lifetime was improved greatly for the DBC substrate with 0.5 mm edge tail length compared with that without edge tail.Research limitations implications - The thermal cracking of DBC substrates should be studied at the microstructure level in the future.Originality value - Thermal cycling induced failure of DBC was analyzed. A method of alleviating the thermal plastic strain distribution on the weakest site and improving the thermal fatigue lifetime of DBC substrates under thermal cycling was proposed. |
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The purpose of this paper is to study the phenomenology of thermal-cracking to determine the suitability of DBC for high-temperature packaging.Design methodology approach - The thermal plastic strain distribution at the edge of the DBC substrate was analyzed by using a finite element method with the Chaboche model for copper. The parameters of the Chaboche model were verified by comparing with the three-point bending test results of DBC substrate. The thermal analyses involving different edge tail lengths indicated that susceptibility to cracking was influenced by the edge geometry of the DBC substrate.Findings - Interface cracking was observed to initiate at the short edge of the bonded copper and propagated into the ceramic layer. The interface crack was caused by the accumulation of thermal plastic strain near the short edge. The edge tail can decrease the thermal strain along the short edge of the DBC substrate. Thermal cycling lifetime was improved greatly for the DBC substrate with 0.5 mm edge tail length compared with that without edge tail.Research limitations implications - The thermal cracking of DBC substrates should be studied at the microstructure level in the future.Originality value - Thermal cycling induced failure of DBC was analyzed. A method of alleviating the thermal plastic strain distribution on the weakest site and improving the thermal fatigue lifetime of DBC substrates under thermal cycling was proposed.</description><identifier>ISSN: 0954-0911</identifier><identifier>EISSN: 1758-6836</identifier><identifier>DOI: 10.1108/09540910910970367</identifier><identifier>CODEN: SSMOEO</identifier><language>eng</language><publisher>Bradford: Emerald Group Publishing Limited</publisher><subject>Alumina ; Applied sciences ; Copper ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Experimental methods ; Fatigue ; Heat treating ; High temperatures ; Integrated circuits ; Interfaces ; Kinematics ; Metal fatigue ; Packaging ; Physical properties ; Research methodology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Simulation ; Stress analysis ; Substrates ; Temperature ; Temperature effects ; Thermal cycling ; Thermal properties of materials</subject><ispartof>Soldering & surface mount technology, 2009-06, Vol.21 (3), p.10-15</ispartof><rights>Emerald Group Publishing Limited</rights><rights>2009 INIST-CNRS</rights><rights>Copyright Emerald Group Publishing Limited 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c449t-efc93c9cfee0d1c036b84f70d2203d6cf2e95b9af3f9f0b5358aa6e338b094b3</citedby><cites>FETCH-LOGICAL-c449t-efc93c9cfee0d1c036b84f70d2203d6cf2e95b9af3f9f0b5358aa6e338b094b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/09540910910970367/full/pdf$$EPDF$$P50$$Gemerald$$H</linktopdf><linktohtml>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/09540910910970367/full/html$$EHTML$$P50$$Gemerald$$H</linktohtml><link.rule.ids>314,780,784,967,11635,27924,27925,52686,52689</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21654015$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Dong, Guangcheng</creatorcontrib><creatorcontrib>Lei, Guangyin (Thomas)</creatorcontrib><creatorcontrib>Chen, Xu</creatorcontrib><creatorcontrib>Ngo, Khai</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><title>Edge tail length effect on reliability of DBC substrates under thermal cycling</title><title>Soldering & surface mount technology</title><description>Purpose - Direct-bond-copper (DBC) substrates crack after about 15 thermal cycles from −55 to 250°C. The purpose of this paper is to study the phenomenology of thermal-cracking to determine the suitability of DBC for high-temperature packaging.Design methodology approach - The thermal plastic strain distribution at the edge of the DBC substrate was analyzed by using a finite element method with the Chaboche model for copper. The parameters of the Chaboche model were verified by comparing with the three-point bending test results of DBC substrate. The thermal analyses involving different edge tail lengths indicated that susceptibility to cracking was influenced by the edge geometry of the DBC substrate.Findings - Interface cracking was observed to initiate at the short edge of the bonded copper and propagated into the ceramic layer. The interface crack was caused by the accumulation of thermal plastic strain near the short edge. The edge tail can decrease the thermal strain along the short edge of the DBC substrate. Thermal cycling lifetime was improved greatly for the DBC substrate with 0.5 mm edge tail length compared with that without edge tail.Research limitations implications - The thermal cracking of DBC substrates should be studied at the microstructure level in the future.Originality value - Thermal cycling induced failure of DBC was analyzed. A method of alleviating the thermal plastic strain distribution on the weakest site and improving the thermal fatigue lifetime of DBC substrates under thermal cycling was proposed.</description><subject>Alumina</subject><subject>Applied sciences</subject><subject>Copper</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Experimental methods</subject><subject>Fatigue</subject><subject>Heat treating</subject><subject>High temperatures</subject><subject>Integrated circuits</subject><subject>Interfaces</subject><subject>Kinematics</subject><subject>Metal fatigue</subject><subject>Packaging</subject><subject>Physical properties</subject><subject>Research methodology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Simulation</subject><subject>Stress analysis</subject><subject>Substrates</subject><subject>Temperature</subject><subject>Temperature effects</subject><subject>Thermal cycling</subject><subject>Thermal properties of materials</subject><issn>0954-0911</issn><issn>1758-6836</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kM9r2zAYhkVZoVnXP2A3UdhOdSdZtmwdtyT9tZJewgq7CFn-lChV7FSSofnvqywlh3UDgQ7v8z68fAh9puSSUlJ_I6IsiKB_XkUYr47QiFZlnfGa8Q9otMuzlNIT9DGEFSGk4IKN0GzaLgBHZR120C3iEoMxoCPuO-zBWdVYZ-MW9wZPfoxxGJoQvYoQ8NC14HFcgl8rh_VWO9stPqFjo1yAs7f_FM2vpvPxTXb_cH07_n6f6aIQMQOjBdNCGwDSUp32NnVhKtLmOWEt1yYHUTZCGWaEIU3JylopDozVDRFFw07R17124_vnAUKUaxs0OKc66IcgGWdU1CVP4Plf4KoffJemyZzynFFOygTRPaR9H4IHIzferpXfSkrk7rry3XVT58ubWAWtnPGq0zYcikmeGnTnzvacDRFeDrnyTzJZqlIWj7m8E5Pf1eznL_mY-Is9D2vwyrWHxrsJctOahJN_4_9f_grf5aPA</recordid><startdate>20090626</startdate><enddate>20090626</enddate><creator>Dong, Guangcheng</creator><creator>Lei, Guangyin (Thomas)</creator><creator>Chen, Xu</creator><creator>Ngo, Khai</creator><creator>Lu, Guo-Quan</creator><general>Emerald Group Publishing Limited</general><general>Emerald</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7RQ</scope><scope>7SP</scope><scope>7TB</scope><scope>7WY</scope><scope>7XB</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K6~</scope><scope>KB.</scope><scope>KR7</scope><scope>L.-</scope><scope>L7M</scope><scope>M0F</scope><scope>M2P</scope><scope>PDBOC</scope><scope>PQBIZ</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope></search><sort><creationdate>20090626</creationdate><title>Edge tail length effect on reliability of DBC substrates under thermal cycling</title><author>Dong, Guangcheng ; Lei, Guangyin (Thomas) ; Chen, Xu ; Ngo, Khai ; Lu, Guo-Quan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c449t-efc93c9cfee0d1c036b84f70d2203d6cf2e95b9af3f9f0b5358aa6e338b094b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Alumina</topic><topic>Applied sciences</topic><topic>Copper</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Experimental methods</topic><topic>Fatigue</topic><topic>Heat treating</topic><topic>High temperatures</topic><topic>Integrated circuits</topic><topic>Interfaces</topic><topic>Kinematics</topic><topic>Metal fatigue</topic><topic>Packaging</topic><topic>Physical properties</topic><topic>Research methodology</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Simulation</topic><topic>Stress analysis</topic><topic>Substrates</topic><topic>Temperature</topic><topic>Temperature effects</topic><topic>Thermal cycling</topic><topic>Thermal properties of materials</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dong, Guangcheng</creatorcontrib><creatorcontrib>Lei, Guangyin (Thomas)</creatorcontrib><creatorcontrib>Chen, Xu</creatorcontrib><creatorcontrib>Ngo, Khai</creatorcontrib><creatorcontrib>Lu, Guo-Quan</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Career & Technical Education Database</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Business Collection</collection><collection>Materials Science Database</collection><collection>Civil Engineering Abstracts</collection><collection>ABI/INFORM Professional Advanced</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Trade & Industry</collection><collection>Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><jtitle>Soldering & surface mount technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dong, Guangcheng</au><au>Lei, Guangyin (Thomas)</au><au>Chen, Xu</au><au>Ngo, Khai</au><au>Lu, Guo-Quan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Edge tail length effect on reliability of DBC substrates under thermal cycling</atitle><jtitle>Soldering & surface mount technology</jtitle><date>2009-06-26</date><risdate>2009</risdate><volume>21</volume><issue>3</issue><spage>10</spage><epage>15</epage><pages>10-15</pages><issn>0954-0911</issn><eissn>1758-6836</eissn><coden>SSMOEO</coden><abstract>Purpose - Direct-bond-copper (DBC) substrates crack after about 15 thermal cycles from −55 to 250°C. The purpose of this paper is to study the phenomenology of thermal-cracking to determine the suitability of DBC for high-temperature packaging.Design methodology approach - The thermal plastic strain distribution at the edge of the DBC substrate was analyzed by using a finite element method with the Chaboche model for copper. The parameters of the Chaboche model were verified by comparing with the three-point bending test results of DBC substrate. The thermal analyses involving different edge tail lengths indicated that susceptibility to cracking was influenced by the edge geometry of the DBC substrate.Findings - Interface cracking was observed to initiate at the short edge of the bonded copper and propagated into the ceramic layer. The interface crack was caused by the accumulation of thermal plastic strain near the short edge. The edge tail can decrease the thermal strain along the short edge of the DBC substrate. Thermal cycling lifetime was improved greatly for the DBC substrate with 0.5 mm edge tail length compared with that without edge tail.Research limitations implications - The thermal cracking of DBC substrates should be studied at the microstructure level in the future.Originality value - Thermal cycling induced failure of DBC was analyzed. A method of alleviating the thermal plastic strain distribution on the weakest site and improving the thermal fatigue lifetime of DBC substrates under thermal cycling was proposed.</abstract><cop>Bradford</cop><pub>Emerald Group Publishing Limited</pub><doi>10.1108/09540910910970367</doi><tpages>6</tpages></addata></record> |
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subjects | Alumina Applied sciences Copper Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Experimental methods Fatigue Heat treating High temperatures Integrated circuits Interfaces Kinematics Metal fatigue Packaging Physical properties Research methodology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Simulation Stress analysis Substrates Temperature Temperature effects Thermal cycling Thermal properties of materials |
title | Edge tail length effect on reliability of DBC substrates under thermal cycling |
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