Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image

A kinematic (geometrical) diffraction simulation model has been developed to provide understanding of direct dislocation images on synchrotron white‐beam X‐ray topographs, and has been successfully applied to illustrate the contrast formation mechanisms involved in images of micropipe‐related supers...

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Veröffentlicht in:	Journal of applied crystallography 1999-06, Vol.32 (3), p.516-524
Hauptverfasser:	Huang, X. R., Dudley, M., Vetter, W. M., Huang, W., Si, W., Carter Jr, C. H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) Exact sciences and technology Linear defects: dislocations, disclinations Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering
Online-Zugang:	Volltext
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