Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films

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Veröffentlicht in:Physical review materials 2020-02, Vol.4 (2), Article 024407
Hauptverfasser: Kelley, K. P., Yilmaz, D. E., Collins, L., Sharma, Y., Lee, H. N., Akbarian, D., van Duin, A. C. T., Ganesh, P., Vasudevan, R. K.
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container_start_page
container_title Physical review materials
container_volume 4
creator Kelley, K. P.
Yilmaz, D. E.
Collins, L.
Sharma, Y.
Lee, H. N.
Akbarian, D.
van Duin, A. C. T.
Ganesh, P.
Vasudevan, R. K.
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doi_str_mv 10.1103/PhysRevMaterials.4.024407
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevMaterials_4_024407</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevMaterials_4_024407</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1067-a0819b43267d95ad014e3787097de6287e67643c6b46b687da98778ef2cb7c033</originalsourceid><addsrcrecordid>eNpdkN9KwzAYxYMoOObeIT5AZ9Kk-ZJLHf6DyWTU65ImX2i0a0dShPn0TuaFeHXOgcPh8CPkmrMl50zcvHaHvMXPFzthirbPS7lkpZQMzsislFAVxlTi_I-_JIuc3xljXFe8BDMj27qL7mPAnKkdPM1TsnGgHvc4eBwc0jHQfcSvEXt0U4qOuhFDiC7iMNFj9c7WcUMFnbpjCLHf5StyEY5ncPGrc_L2cF-vnor15vF5dbsuHGcKCss0N60UpQJvKusZlyhAAzPgUZUaUIGSwqlWqlZp8NZoAI2hdC04JsScmNOuS2POCUOzT3Fn06HhrPnh0_zn08jmxEd8A-GwXeE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films</title><source>American Physical Society Journals</source><creator>Kelley, K. P. ; Yilmaz, D. E. ; Collins, L. ; Sharma, Y. ; Lee, H. N. ; Akbarian, D. ; van Duin, A. C. T. ; Ganesh, P. ; Vasudevan, R. K.</creator><creatorcontrib>Kelley, K. P. ; Yilmaz, D. E. ; Collins, L. ; Sharma, Y. ; Lee, H. N. ; Akbarian, D. ; van Duin, A. C. T. ; Ganesh, P. ; Vasudevan, R. K.</creatorcontrib><identifier>ISSN: 2475-9953</identifier><identifier>EISSN: 2475-9953</identifier><identifier>DOI: 10.1103/PhysRevMaterials.4.024407</identifier><language>eng</language><ispartof>Physical review materials, 2020-02, Vol.4 (2), Article 024407</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1067-a0819b43267d95ad014e3787097de6287e67643c6b46b687da98778ef2cb7c033</citedby><cites>FETCH-LOGICAL-c1067-a0819b43267d95ad014e3787097de6287e67643c6b46b687da98778ef2cb7c033</cites><orcidid>0000-0003-4692-8579 ; 0000-0001-8532-4036</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2876,2877,27924,27925</link.rule.ids></links><search><creatorcontrib>Kelley, K. P.</creatorcontrib><creatorcontrib>Yilmaz, D. E.</creatorcontrib><creatorcontrib>Collins, L.</creatorcontrib><creatorcontrib>Sharma, Y.</creatorcontrib><creatorcontrib>Lee, H. N.</creatorcontrib><creatorcontrib>Akbarian, D.</creatorcontrib><creatorcontrib>van Duin, A. C. T.</creatorcontrib><creatorcontrib>Ganesh, P.</creatorcontrib><creatorcontrib>Vasudevan, R. K.</creatorcontrib><title>Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films</title><title>Physical review materials</title><issn>2475-9953</issn><issn>2475-9953</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpdkN9KwzAYxYMoOObeIT5AZ9Kk-ZJLHf6DyWTU65ImX2i0a0dShPn0TuaFeHXOgcPh8CPkmrMl50zcvHaHvMXPFzthirbPS7lkpZQMzsislFAVxlTi_I-_JIuc3xljXFe8BDMj27qL7mPAnKkdPM1TsnGgHvc4eBwc0jHQfcSvEXt0U4qOuhFDiC7iMNFj9c7WcUMFnbpjCLHf5StyEY5ncPGrc_L2cF-vnor15vF5dbsuHGcKCss0N60UpQJvKusZlyhAAzPgUZUaUIGSwqlWqlZp8NZoAI2hdC04JsScmNOuS2POCUOzT3Fn06HhrPnh0_zn08jmxEd8A-GwXeE</recordid><startdate>202002</startdate><enddate>202002</enddate><creator>Kelley, K. P.</creator><creator>Yilmaz, D. E.</creator><creator>Collins, L.</creator><creator>Sharma, Y.</creator><creator>Lee, H. N.</creator><creator>Akbarian, D.</creator><creator>van Duin, A. C. T.</creator><creator>Ganesh, P.</creator><creator>Vasudevan, R. K.</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0003-4692-8579</orcidid><orcidid>https://orcid.org/0000-0001-8532-4036</orcidid></search><sort><creationdate>202002</creationdate><title>Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films</title><author>Kelley, K. P. ; Yilmaz, D. E. ; Collins, L. ; Sharma, Y. ; Lee, H. N. ; Akbarian, D. ; van Duin, A. C. T. ; Ganesh, P. ; Vasudevan, R. K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1067-a0819b43267d95ad014e3787097de6287e67643c6b46b687da98778ef2cb7c033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kelley, K. P.</creatorcontrib><creatorcontrib>Yilmaz, D. E.</creatorcontrib><creatorcontrib>Collins, L.</creatorcontrib><creatorcontrib>Sharma, Y.</creatorcontrib><creatorcontrib>Lee, H. N.</creatorcontrib><creatorcontrib>Akbarian, D.</creatorcontrib><creatorcontrib>van Duin, A. C. T.</creatorcontrib><creatorcontrib>Ganesh, P.</creatorcontrib><creatorcontrib>Vasudevan, R. K.</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kelley, K. P.</au><au>Yilmaz, D. E.</au><au>Collins, L.</au><au>Sharma, Y.</au><au>Lee, H. N.</au><au>Akbarian, D.</au><au>van Duin, A. C. T.</au><au>Ganesh, P.</au><au>Vasudevan, R. K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films</atitle><jtitle>Physical review materials</jtitle><date>2020-02</date><risdate>2020</risdate><volume>4</volume><issue>2</issue><artnum>024407</artnum><issn>2475-9953</issn><eissn>2475-9953</eissn><doi>10.1103/PhysRevMaterials.4.024407</doi><orcidid>https://orcid.org/0000-0003-4692-8579</orcidid><orcidid>https://orcid.org/0000-0001-8532-4036</orcidid></addata></record>
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title Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T15%3A37%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Thickness%20and%20strain%20dependence%20of%20piezoelectric%20coefficient%20in%20BaTiO%203%20thin%20films&rft.jtitle=Physical%20review%20materials&rft.au=Kelley,%20K.%20P.&rft.date=2020-02&rft.volume=4&rft.issue=2&rft.artnum=024407&rft.issn=2475-9953&rft.eissn=2475-9953&rft_id=info:doi/10.1103/PhysRevMaterials.4.024407&rft_dat=%3Ccrossref%3E10_1103_PhysRevMaterials_4_024407%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true