Current-Voltage Characteristics of Self-Assembled Monolayers by Scanning Tunneling Microscopy

Current-Voltage Characteristics of Self-Assembled Monolayers by Scanning Tunneling Microscopy

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Veröffentlicht in:Physical review letters 1997-09, Vol.79 (13), p.2530-2533
Hauptverfasser: Datta, Supriyo, Tian, Weidong, Hong, Seunghun, Reifenberger, R., Henderson, Jason I., Kubiak, Clifford P.
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container_end_page 2533
container_issue 13
container_start_page 2530
container_title Physical review letters
container_volume 79
creator Datta, Supriyo
Tian, Weidong
Hong, Seunghun
Reifenberger, R.
Henderson, Jason I.
Kubiak, Clifford P.
description
doi_str_mv 10.1103/PhysRevLett.79.2530
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title Current-Voltage Characteristics of Self-Assembled Monolayers by Scanning Tunneling Microscopy
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