Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Physical review letters 1982-01, Vol.49 (22), p.1674-1677
Hauptverfasser:	Wheeler, R. G., Choi, K. K., Goel, A., Wisnieff, R., Prober, D. E.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	1677
container_issue	22
container_start_page	1674
container_title	Physical review letters
container_volume	49
creator	Wheeler, R. G. Choi, K. K. Goel, A. Wisnieff, R. Prober, D. E.
description
doi_str_mv	10.1103/PhysRevLett.49.1674
format	Article
fullrecord	<record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevLett_49_1674</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevLett_49_1674</sourcerecordid><originalsourceid>FETCH-LOGICAL-c313t-f4f3bd7f1b933ecdfd08489834b52e993035219777e74c8f25931a796fb70a4c3</originalsourceid><addsrcrecordid>eNpNkM1KxDAUhbNQcBx9Ajd9gdab3rRpljJUHSgo_iC4CWmaMJFOK0kcqE9v6w-4uofLx-HwEXJBIaMU8PJ-N4UHc2hMjBkTGS05OyIrAKSpAOAn5DSENwCgeVmtyGszatW7TxXdOCRq6JK6Nzr6cUj_QrIdovFKfxO1tfM3JG5IHj_avdML-eK6uJuxg_FhgRo1zemMHFvVB3P-e9fk-bp-2tymzd3NdnPVpBopxtQyi23HLW0FotGd7aBilaiQtUVuhEDAIqeCc24405XNC4FUcVHaloNiGtcEf3rnLSF4Y-W7d3vlJ0lBLkrkPyWSCbkowS_YM1s3</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers</title><source>American Physical Society Journals</source><creator>Wheeler, R. G. ; Choi, K. K. ; Goel, A. ; Wisnieff, R. ; Prober, D. E.</creator><creatorcontrib>Wheeler, R. G. ; Choi, K. K. ; Goel, A. ; Wisnieff, R. ; Prober, D. E.</creatorcontrib><identifier>ISSN: 0031-9007</identifier><identifier>DOI: 10.1103/PhysRevLett.49.1674</identifier><language>eng</language><ispartof>Physical review letters, 1982-01, Vol.49 (22), p.1674-1677</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c313t-f4f3bd7f1b933ecdfd08489834b52e993035219777e74c8f25931a796fb70a4c3</citedby><cites>FETCH-LOGICAL-c313t-f4f3bd7f1b933ecdfd08489834b52e993035219777e74c8f25931a796fb70a4c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2876,2877,27924,27925</link.rule.ids></links><search><creatorcontrib>Wheeler, R. G.</creatorcontrib><creatorcontrib>Choi, K. K.</creatorcontrib><creatorcontrib>Goel, A.</creatorcontrib><creatorcontrib>Wisnieff, R.</creatorcontrib><creatorcontrib>Prober, D. E.</creatorcontrib><title>Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers</title><title>Physical review letters</title><issn>0031-9007</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1982</creationdate><recordtype>article</recordtype><recordid>eNpNkM1KxDAUhbNQcBx9Ajd9gdab3rRpljJUHSgo_iC4CWmaMJFOK0kcqE9v6w-4uofLx-HwEXJBIaMU8PJ-N4UHc2hMjBkTGS05OyIrAKSpAOAn5DSENwCgeVmtyGszatW7TxXdOCRq6JK6Nzr6cUj_QrIdovFKfxO1tfM3JG5IHj_avdML-eK6uJuxg_FhgRo1zemMHFvVB3P-e9fk-bp-2tymzd3NdnPVpBopxtQyi23HLW0FotGd7aBilaiQtUVuhEDAIqeCc24405XNC4FUcVHaloNiGtcEf3rnLSF4Y-W7d3vlJ0lBLkrkPyWSCbkowS_YM1s3</recordid><startdate>19820101</startdate><enddate>19820101</enddate><creator>Wheeler, R. G.</creator><creator>Choi, K. K.</creator><creator>Goel, A.</creator><creator>Wisnieff, R.</creator><creator>Prober, D. E.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19820101</creationdate><title>Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers</title><author>Wheeler, R. G. ; Choi, K. K. ; Goel, A. ; Wisnieff, R. ; Prober, D. E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c313t-f4f3bd7f1b933ecdfd08489834b52e993035219777e74c8f25931a796fb70a4c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1982</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wheeler, R. G.</creatorcontrib><creatorcontrib>Choi, K. K.</creatorcontrib><creatorcontrib>Goel, A.</creatorcontrib><creatorcontrib>Wisnieff, R.</creatorcontrib><creatorcontrib>Prober, D. E.</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wheeler, R. G.</au><au>Choi, K. K.</au><au>Goel, A.</au><au>Wisnieff, R.</au><au>Prober, D. E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers</atitle><jtitle>Physical review letters</jtitle><date>1982-01-01</date><risdate>1982</risdate><volume>49</volume><issue>22</issue><spage>1674</spage><epage>1677</epage><pages>1674-1677</pages><issn>0031-9007</issn><doi>10.1103/PhysRevLett.49.1674</doi><tpages>4</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0031-9007
ispartof	Physical review letters, 1982-01, Vol.49 (22), p.1674-1677
issn	0031-9007
language	eng
recordid	cdi_crossref_primary_10_1103_PhysRevLett_49_1674
source	American Physical Society Journals
title	Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion Layers
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T08%3A30%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Localization%20and%20Electron-Electron%20Interaction%20Effects%20in%20Submicron-Width%20Inversion%20Layers&rft.jtitle=Physical%20review%20letters&rft.au=Wheeler,%20R.%20G.&rft.date=1982-01-01&rft.volume=49&rft.issue=22&rft.spage=1674&rft.epage=1677&rft.pages=1674-1677&rft.issn=0031-9007&rft_id=info:doi/10.1103/PhysRevLett.49.1674&rft_dat=%3Ccrossref%3E10_1103_PhysRevLett_49_1674%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true