Scattering near-field optical microscopy of optically anisotropic systems
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Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2005-03, Vol.71 (11), p.115418.1-115418.8, Article 115418 |
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container_issue | 11 |
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container_title | Physical review. B, Condensed matter and materials physics |
container_volume | 71 |
creator | SCHNEIDER, S. C GRAFSTRÖM, S ENG, L. M |
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doi_str_mv | 10.1103/PhysRevB.71.115418 |
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ispartof | Physical review. B, Condensed matter and materials physics, 2005-03, Vol.71 (11), p.115418.1-115418.8, Article 115418 |
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language | eng |
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source | American Physical Society Journals |
subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Dielectrics, piezoelectrics, and ferroelectrics and their properties Domain structure hysteresis Exact sciences and technology Ferroelectricity and antiferroelectricity Materials science Materials testing Physics |
title | Scattering near-field optical microscopy of optically anisotropic systems |
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