Low-temperature electron-phonon interaction in Si MOSFETs
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Veröffentlicht in: | Physical review. B, Condensed matter Condensed matter, 1998, Vol.57 (4), p.2443-2446 |
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container_issue | 4 |
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container_title | Physical review. B, Condensed matter |
container_volume | 57 |
creator | Zieve, R. J. Prober, D. E. Wheeler, R. G. |
description | |
doi_str_mv | 10.1103/PhysRevB.57.2443 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevB_57_2443</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevB_57_2443</sourcerecordid><originalsourceid>FETCH-LOGICAL-c241t-52ebf0b7b548bb2ddfb28e3ba5ca536a20b5f3f4745934a7ffa03f8e875eb0f13</originalsourceid><addsrcrecordid>eNo1j8tOwzAURC0EEqGwZ5kfcLl-xfESKl5SUBGFtWWn12pQm0S2AfXvSXnMZkYz0kiHkEsGc8ZAXD1v9ukFP2_mSs-5lOKIFAyMokIbdUwKYJWgrObmlJyl9A6TeGUKYprhi2bcjRhd_ohY4hbbHIeejpuhH_qy6_M0tbn7yeWqK5-Wq7vb13ROToLbJrz48xl5m-rFA22W94-L64a2XLJMFUcfwGuvZO09X6-D5zUK71TrlKgcB6-CCFJLZYR0OgQHItRYa4UeAhMzAr-_bRxSihjsGLudi3vLwB7Q7T-6Vdoe0MU3-h9O6g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Low-temperature electron-phonon interaction in Si MOSFETs</title><source>American Physical Society Journals</source><creator>Zieve, R. J. ; Prober, D. E. ; Wheeler, R. G.</creator><creatorcontrib>Zieve, R. J. ; Prober, D. E. ; Wheeler, R. G.</creatorcontrib><identifier>ISSN: 0163-1829</identifier><identifier>EISSN: 1095-3795</identifier><identifier>DOI: 10.1103/PhysRevB.57.2443</identifier><language>eng</language><ispartof>Physical review. B, Condensed matter, 1998, Vol.57 (4), p.2443-2446</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c241t-52ebf0b7b548bb2ddfb28e3ba5ca536a20b5f3f4745934a7ffa03f8e875eb0f13</citedby><cites>FETCH-LOGICAL-c241t-52ebf0b7b548bb2ddfb28e3ba5ca536a20b5f3f4745934a7ffa03f8e875eb0f13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2876,2877,4024,27923,27924,27925</link.rule.ids></links><search><creatorcontrib>Zieve, R. J.</creatorcontrib><creatorcontrib>Prober, D. E.</creatorcontrib><creatorcontrib>Wheeler, R. G.</creatorcontrib><title>Low-temperature electron-phonon interaction in Si MOSFETs</title><title>Physical review. B, Condensed matter</title><issn>0163-1829</issn><issn>1095-3795</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNo1j8tOwzAURC0EEqGwZ5kfcLl-xfESKl5SUBGFtWWn12pQm0S2AfXvSXnMZkYz0kiHkEsGc8ZAXD1v9ukFP2_mSs-5lOKIFAyMokIbdUwKYJWgrObmlJyl9A6TeGUKYprhi2bcjRhd_ohY4hbbHIeejpuhH_qy6_M0tbn7yeWqK5-Wq7vb13ROToLbJrz48xl5m-rFA22W94-L64a2XLJMFUcfwGuvZO09X6-D5zUK71TrlKgcB6-CCFJLZYR0OgQHItRYa4UeAhMzAr-_bRxSihjsGLudi3vLwB7Q7T-6Vdoe0MU3-h9O6g</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Zieve, R. J.</creator><creator>Prober, D. E.</creator><creator>Wheeler, R. G.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1998</creationdate><title>Low-temperature electron-phonon interaction in Si MOSFETs</title><author>Zieve, R. J. ; Prober, D. E. ; Wheeler, R. G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c241t-52ebf0b7b548bb2ddfb28e3ba5ca536a20b5f3f4745934a7ffa03f8e875eb0f13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Zieve, R. J.</creatorcontrib><creatorcontrib>Prober, D. E.</creatorcontrib><creatorcontrib>Wheeler, R. G.</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zieve, R. J.</au><au>Prober, D. E.</au><au>Wheeler, R. G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-temperature electron-phonon interaction in Si MOSFETs</atitle><jtitle>Physical review. B, Condensed matter</jtitle><date>1998</date><risdate>1998</risdate><volume>57</volume><issue>4</issue><spage>2443</spage><epage>2446</epage><pages>2443-2446</pages><issn>0163-1829</issn><eissn>1095-3795</eissn><doi>10.1103/PhysRevB.57.2443</doi><tpages>4</tpages></addata></record> |
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identifier | ISSN: 0163-1829 |
ispartof | Physical review. B, Condensed matter, 1998, Vol.57 (4), p.2443-2446 |
issn | 0163-1829 1095-3795 |
language | eng |
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source | American Physical Society Journals |
title | Low-temperature electron-phonon interaction in Si MOSFETs |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T18%3A12%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Low-temperature%20electron-phonon%20interaction%20in%20Si%20MOSFETs&rft.jtitle=Physical%20review.%20B,%20Condensed%20matter&rft.au=Zieve,%20R.%20J.&rft.date=1998&rft.volume=57&rft.issue=4&rft.spage=2443&rft.epage=2446&rft.pages=2443-2446&rft.issn=0163-1829&rft.eissn=1095-3795&rft_id=info:doi/10.1103/PhysRevB.57.2443&rft_dat=%3Ccrossref%3E10_1103_PhysRevB_57_2443%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |