Numerical modeling of defects induced dark current in halide perovskite X-ray detectors

Metal halide perovskites have been widely used in x-ray detection due to their outstanding optoelectronic properties. However, the dark current of perovskite x-ray detectors is not appreciably low for integration on thin-film transistors pixel circuits and thus limits their applications in X-ray ima...

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Veröffentlicht in:	Physica scripta 2024-02, Vol.99 (2), p.25995
Hauptverfasser:	Yang, Bin, Xie, Xiangfan, Zeng, Shengqiao, Xue, Bin, Xiao, Shuang, Qian, Lihua
Format:	Artikel
Sprache:	eng
Schlagworte:	dark current halide perovskite interfacial defects numerical modeling x-ray detectors
Online-Zugang:	Volltext
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