Abnormal spectral distortion of a silicon sensor-based single photon counting charge coupled device (PIXIS-XB: 1300R) in detecting laser plasma x-ray source of 20-100 keV

Single photon counting using a charge-coupled device (CCD) is a conventional method of measuring the x-ray production of laser plasma. But the spectrum is seriously distorted when measuring a short pulse laser plasma x-ray source. Here we explore this abnormal spectral distortion using a silicon sen...

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Veröffentlicht in:	Plasma physics and controlled fusion 2019-09, Vol.61 (9), p.95008
Hauptverfasser:	Yang, Tao, Hu, Guang-yue, Yuan, Peng, Tao, Tao, Zhou, Xu, Wu, Jin-jie, Zheng, Jian
Format:	Artikel
Sprache:	eng
Schlagworte:	CCD laser plasma single photon counting spectral distortion x-ray
Online-Zugang:	Volltext
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