Defect localization in high-power vertical cavity surface emitting laser arrays by means of reverse biased emission microscopy

Defect localization in high-power vertical cavity surface emitting laser arrays by means of reverse biased emission microscopy

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Veröffentlicht in:Measurement science & technology 2021-09, Vol.32 (9), p.95406
Hauptverfasser: Fabbro, Robert, Haber, Thomas, Fasching, Gernot, Coppeta, Raffaele, Pusterhofer, Michael, Grogger, Werner
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container_issue 9
container_start_page 95406
container_title Measurement science & technology
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creator Fabbro, Robert
Haber, Thomas
Fasching, Gernot
Coppeta, Raffaele
Pusterhofer, Michael
Grogger, Werner
description
doi_str_mv 10.1088/1361-6501/abf730
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title Defect localization in high-power vertical cavity surface emitting laser arrays by means of reverse biased emission microscopy
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