An approach to determine the easy axis of magnetic film by anisotropic magnetoresistance measurements
A series of Ta/NiCo/Ta films was grown through DC-sputtering. During deposition, a constant magnetic field was applied along the substrate in different directions to induce different orientations of the easy axis. Three different magnitudes of external fields were applied in the angle-dependent anis...
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| Veröffentlicht in: | Journal of physics. Condensed matter 2020-05, Vol.32 (23), p.235802-235802, Article 235802 |
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| container_end_page | 235802 |
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| container_issue | 23 |
| container_start_page | 235802 |
| container_title | Journal of physics. Condensed matter |
| container_volume | 32 |
| creator | Du, Wei Tang, Xiaoli Liu, Mengli Su, Hua Han, Genliang Lu, Qihai |
| description | A series of Ta/NiCo/Ta films was grown through DC-sputtering. During deposition, a constant magnetic field was applied along the substrate in different directions to induce different orientations of the easy axis. Three different magnitudes of external fields were applied in the angle-dependent anisotropic magnetoresistance (AMR) measurements of the samples. Through an effective analysis, the angle-direction extracted via the intersection of three angle-dependent AMR curves was confirmed as the easy axis. Compared to the normal methods applied to achieve the easy axis, the results are convincing. This new method provides an effective, convenient and low cost way of studying magnetic materials and devices. |
| doi_str_mv | 10.1088/1361-648X/ab5ca3 |
| format | Article |
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During deposition, a constant magnetic field was applied along the substrate in different directions to induce different orientations of the easy axis. Three different magnitudes of external fields were applied in the angle-dependent anisotropic magnetoresistance (AMR) measurements of the samples. Through an effective analysis, the angle-direction extracted via the intersection of three angle-dependent AMR curves was confirmed as the easy axis. Compared to the normal methods applied to achieve the easy axis, the results are convincing. This new method provides an effective, convenient and low cost way of studying magnetic materials and devices.</description><identifier>ISSN: 0953-8984</identifier><identifier>EISSN: 1361-648X</identifier><identifier>DOI: 10.1088/1361-648X/ab5ca3</identifier><identifier>PMID: 31778978</identifier><identifier>CODEN: JCOMEL</identifier><language>eng</language><publisher>BRISTOL: IOP Publishing</publisher><subject>angle-dependent ; anisotropic magnetoresistance ; easy axis ; magnetic materials ; measurement ; Physical Sciences ; Physics ; Physics, Condensed Matter ; Science & Technology</subject><ispartof>Journal of physics. 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Condensed matter</title><addtitle>JPhysCM</addtitle><addtitle>J PHYS-CONDENS MAT</addtitle><addtitle>J. Phys.: Condens. Matter</addtitle><description>A series of Ta/NiCo/Ta films was grown through DC-sputtering. During deposition, a constant magnetic field was applied along the substrate in different directions to induce different orientations of the easy axis. Three different magnitudes of external fields were applied in the angle-dependent anisotropic magnetoresistance (AMR) measurements of the samples. Through an effective analysis, the angle-direction extracted via the intersection of three angle-dependent AMR curves was confirmed as the easy axis. Compared to the normal methods applied to achieve the easy axis, the results are convincing. This new method provides an effective, convenient and low cost way of studying magnetic materials and devices.</description><subject>angle-dependent</subject><subject>anisotropic magnetoresistance</subject><subject>easy axis</subject><subject>magnetic materials</subject><subject>measurement</subject><subject>Physical Sciences</subject><subject>Physics</subject><subject>Physics, Condensed Matter</subject><subject>Science & Technology</subject><issn>0953-8984</issn><issn>1361-648X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AOWDO</sourceid><recordid>eNqNkM9rHSEQx6U0NK9p7z0Vj4V2E111V4_h0V8Q6CWF3kTdsTG81a26tPnv42PTdyv0NMPM5zvoB6E3lFxSIuUVZQPtBi5_XBkrnGHP0O40eo52RAnWSSX5OXpZyj0hhEvGX6BzRsdRqlHuEFxHbJYlJ-PucE14ggp5DhFwvQMMpjxg8ycUnDyezc8INTjsw2HGti1iKKnmtLTZtkwZSijVRAd4buE1wwyxllfozJtDgddP9QJ9__Txdv-lu_n2-ev--qZzjA21M5aIflR8MhP0xFLJmLdKeSFHTi1XRtpBgVATcPATEcJxagYLMDDirZ3YBXq33W0f-rVCqXoOxcHhYCKkteie9YSNI6GkoWRDXU6lZPB6yWE2-UFToo9y9dGkPprUm9wWeft0fbUzTKfAX5sNeL8Bv8EmX1yAJuKENf2iJ3wYROsIbbT8f3ofqqkhxX1aY23RD1s0pEXfpzXHZvXfD38EXr6m7A</recordid><startdate>20200527</startdate><enddate>20200527</enddate><creator>Du, Wei</creator><creator>Tang, Xiaoli</creator><creator>Liu, Mengli</creator><creator>Su, Hua</creator><creator>Han, Genliang</creator><creator>Lu, Qihai</creator><general>IOP Publishing</general><general>Iop Publishing Ltd</general><scope>AOWDO</scope><scope>BLEPL</scope><scope>DTL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-6951-9252</orcidid><orcidid>https://orcid.org/0000-0002-9477-3375</orcidid></search><sort><creationdate>20200527</creationdate><title>An approach to determine the easy axis of magnetic film by anisotropic magnetoresistance measurements</title><author>Du, Wei ; Tang, Xiaoli ; Liu, Mengli ; Su, Hua ; Han, Genliang ; Lu, Qihai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-ab052794dade20b1833fb99f58741b49a8b69e59de4efd055c41a6bee630fbbd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>angle-dependent</topic><topic>anisotropic magnetoresistance</topic><topic>easy axis</topic><topic>magnetic materials</topic><topic>measurement</topic><topic>Physical Sciences</topic><topic>Physics</topic><topic>Physics, Condensed Matter</topic><topic>Science & Technology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Du, Wei</creatorcontrib><creatorcontrib>Tang, Xiaoli</creatorcontrib><creatorcontrib>Liu, Mengli</creatorcontrib><creatorcontrib>Su, Hua</creatorcontrib><creatorcontrib>Han, Genliang</creatorcontrib><creatorcontrib>Lu, Qihai</creatorcontrib><collection>Web of Science - Science Citation Index Expanded - 2020</collection><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of physics. Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Du, Wei</au><au>Tang, Xiaoli</au><au>Liu, Mengli</au><au>Su, Hua</au><au>Han, Genliang</au><au>Lu, Qihai</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An approach to determine the easy axis of magnetic film by anisotropic magnetoresistance measurements</atitle><jtitle>Journal of physics. Condensed matter</jtitle><stitle>JPhysCM</stitle><stitle>J PHYS-CONDENS MAT</stitle><addtitle>J. Phys.: Condens. Matter</addtitle><date>2020-05-27</date><risdate>2020</risdate><volume>32</volume><issue>23</issue><spage>235802</spage><epage>235802</epage><pages>235802-235802</pages><artnum>235802</artnum><issn>0953-8984</issn><eissn>1361-648X</eissn><coden>JCOMEL</coden><abstract>A series of Ta/NiCo/Ta films was grown through DC-sputtering. During deposition, a constant magnetic field was applied along the substrate in different directions to induce different orientations of the easy axis. Three different magnitudes of external fields were applied in the angle-dependent anisotropic magnetoresistance (AMR) measurements of the samples. Through an effective analysis, the angle-direction extracted via the intersection of three angle-dependent AMR curves was confirmed as the easy axis. Compared to the normal methods applied to achieve the easy axis, the results are convincing. This new method provides an effective, convenient and low cost way of studying magnetic materials and devices.</abstract><cop>BRISTOL</cop><pub>IOP Publishing</pub><pmid>31778978</pmid><doi>10.1088/1361-648X/ab5ca3</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-6951-9252</orcidid><orcidid>https://orcid.org/0000-0002-9477-3375</orcidid></addata></record> |
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| source | IOP Publishing Journals; Web of Science - Science Citation Index Expanded - 2020<img src="https://exlibris-pub.s3.amazonaws.com/fromwos-v2.jpg" />; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | angle-dependent anisotropic magnetoresistance easy axis magnetic materials measurement Physical Sciences Physics Physics, Condensed Matter Science & Technology |
| title | An approach to determine the easy axis of magnetic film by anisotropic magnetoresistance measurements |
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