Thermoreflectance profile analysis and multiparameter 3D fitting model applied to the measurement of thermal parameters of thin film materials

We describe a pump-probe technique for measuring the thermal properties of homogenous and isotropic thin films. We show how a single noncontact measurement as function of the position between pump and probe beams can determine simultaneously and with high accuracy the thermal diffusivity, the therma...

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Veröffentlicht in:	Journal of physics. D, Applied physics Applied physics, 2019-05, Vol.52 (20), p.205303
Hauptverfasser:	Badine, Elie, Bardoux, Mathieux, Abboud, Nadine, Depriester, Michael, Longuemart, Stéphane, Herro, Ziad, Hadj Sahraoui, Abdelhak
Format:	Artikel
Sprache:	eng
Schlagworte:	3D model Physics thermal properties thermal resistance thermoreflectance thin films
Online-Zugang:	Volltext
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