X-ray dark-field imaging with a single absorption grating

X-ray dark-field imaging with a single absorption grating

X-ray dark-field imaging is usually performed with a Talbot-Lau interferometer, but the quality of its analyser grating is limited by the fabrication process. This makes it difficult to achieve a large area and high aspect ratio. In this study, the analyser grating is abandoned and dark-field imagin...

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Veröffentlicht in:Journal of physics. D, Applied physics Applied physics, 2019-05, Vol.52 (19), p.195401
Hauptverfasser: Yang, Jun, Zong, Fangke, Lei, Yaohu, Huang, Jianheng, Liu, Jinyuan, Guo, Jinchuan
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Sprache:eng
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dark-field imaging
phase contrast
x-ray imaging
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container_issue 19
container_start_page 195401
container_title Journal of physics. D, Applied physics
container_volume 52
creator Yang, Jun
Zong, Fangke
Lei, Yaohu
Huang, Jianheng
Liu, Jinyuan
Guo, Jinchuan
description X-ray dark-field imaging is usually performed with a Talbot-Lau interferometer, but the quality of its analyser grating is limited by the fabrication process. This makes it difficult to achieve a large area and high aspect ratio. In this study, the analyser grating is abandoned and dark-field imaging is realized using only one absorption grating. The optimal grating position is derived theoretically in the single absorption grating x-ray dark-field imaging, and the conclusion is partially verified by the experiment. Meanwhile, the optimal object position for dark-field imaging has also been obtained from both the theory and experiment. In the process of comparing x-ray dark-field imaging with x-ray refraction imaging, it is found that both of them can be explained by geometric optics, showing the intrinsic relationship between them.
doi_str_mv 10.1088/1361-6463/ab0807
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subjects dark-field imaging
phase contrast
x-ray imaging
title X-ray dark-field imaging with a single absorption grating
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