Anisotropy in the resistivity of thin aluminium films

The electrical resistivity of 14 specimens of aluminium single crystal films has been measured in the temperature region between 2°K and 15°K. The specimens were prepared in groups of equal thickness, and it was found that the resistivity depends on the crystal orientation. This size-dependent aniso...

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Veröffentlicht in:	Philosophical magazine (London, England : 1945) England : 1945), 1969-11, Vol.20 (167), p.895-905
Hauptverfasser:	Risnes, R., Sollien, V.
Format:	Artikel
Sprache:	eng
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description	The electrical resistivity of 14 specimens of aluminium single crystal films has been measured in the temperature region between 2°K and 15°K. The specimens were prepared in groups of equal thickness, and it was found that the resistivity depends on the crystal orientation. This size-dependent anisotropy is explained by a simple model which treats the electrons near the zone boundaries as ineffective, and the agreement between the theoretical predictions and the experimental results is good.
doi_str_mv	10.1080/14786436908228059
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title	Anisotropy in the resistivity of thin aluminium films
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