Electromechanical effects in free standing FLC elastomer films as determined by interferometric measurements

The electrically induced thickness variations of homeotropically oriented free standing films of a smectic (C* and A*) ferroelectric liquid crystalline elastomer (FLCE) have been examined. For this purpose an interferometric setup has been built with a resolution of 3 pm at 133 Hz AC excitation freq...

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Veröffentlicht in:Ferroelectrics 2000-01, Vol.243 (1), p.107-114
Hauptverfasser: Lehmann, Walter, Skupin, Holger, Kremer, Friedrich, Gebhard, Elisabeth, Zentel, Rudolf
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container_end_page 114
container_issue 1
container_start_page 107
container_title Ferroelectrics
container_volume 243
creator Lehmann, Walter
Skupin, Holger
Kremer, Friedrich
Gebhard, Elisabeth
Zentel, Rudolf
description The electrically induced thickness variations of homeotropically oriented free standing films of a smectic (C* and A*) ferroelectric liquid crystalline elastomer (FLCE) have been examined. For this purpose an interferometric setup has been built with a resolution of 3 pm at 133 Hz AC excitation frequency. The laser beam has been focussed by means of two "long distance" microscope objective lenses in order to study small homogeneous areas in the film. The changes in optical pathlength through the sample were measured at the first (ω), second (2ω) and fourth (4ω) harmonic of the AC-electric excitation voltage (ω=133 Hz). The measured thickness (optical pathlength) modulation at the 2 nd harmonic is in the range of some % and thus stronger than expected from FTIR-measurements on the electroclinic effect in CaF 2 cells filled with this sample. Nevertheless, the strength of this quadratic effect and also of the linear effect is greatly increased at the phase transition Sm-C*-Sm-A*, which indicates a correlation of the thickness variation with the electroclinic effect.
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free standing films: electromechanical effects
liquid crystalline elastomers
piezoelectric
title Electromechanical effects in free standing FLC elastomer films as determined by interferometric measurements
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