Nano- to microscale structural and compositional heterogeneity of artificial pinning centers in pulsed-laser-deposited YBa2Cu3O7−y thin films
The structure, composition, and spatial distribution heterogeneity of artificial pinning centers affect the critical current density of REBa2Cu3O7−y (RE: rare earth) coated conductors. Nanoscale structures and compositions have been analyzed with transmission electron microscopy (TEM) and scanning t...
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| Veröffentlicht in: | Journal of applied physics 2023-07, Vol.134 (4) |
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| creator | Kuroki, Masanari Horide, Tomoya Matsumoto, Kaname Ishimaru, Manabu |
| description | The structure, composition, and spatial distribution heterogeneity of artificial pinning centers affect the critical current density of REBa2Cu3O7−y (RE: rare earth) coated conductors. Nanoscale structures and compositions have been analyzed with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). However, microscale heterogeneity has been difficult to characterize. Here, YBa2Cu3O7−y thin films doped with double-perovskite Ba2YbNbO6 were prepared via pulsed-laser deposition and characterized with TEM, STEM, and scanning electron microscopy (SEM). Cross-sectional and plan-view TEM/STEM imaging revealed hybrid pinning structures consisting of nanorods, nanoparticles, and planar defects that were formed spontaneously. Nanorods were imaged with high spatial resolution via field-emission SEM of thin-foil specimens. Focused-ion-beam (FIB) micro-sectioning enables SEM imaging of microscale heterogeneity in nanorod spatial distributions. By using TEM/STEM in conjunction with FIB-SEM, the coated conductor inhomogeneity was directly evaluated from the nano- to micrometer scales. |
| doi_str_mv | 10.1063/5.0155145 |
| format | Article |
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Nanoscale structures and compositions have been analyzed with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). However, microscale heterogeneity has been difficult to characterize. Here, YBa2Cu3O7−y thin films doped with double-perovskite Ba2YbNbO6 were prepared via pulsed-laser deposition and characterized with TEM, STEM, and scanning electron microscopy (SEM). Cross-sectional and plan-view TEM/STEM imaging revealed hybrid pinning structures consisting of nanorods, nanoparticles, and planar defects that were formed spontaneously. Nanorods were imaged with high spatial resolution via field-emission SEM of thin-foil specimens. Focused-ion-beam (FIB) micro-sectioning enables SEM imaging of microscale heterogeneity in nanorod spatial distributions. 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Nanoscale structures and compositions have been analyzed with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). However, microscale heterogeneity has been difficult to characterize. Here, YBa2Cu3O7−y thin films doped with double-perovskite Ba2YbNbO6 were prepared via pulsed-laser deposition and characterized with TEM, STEM, and scanning electron microscopy (SEM). Cross-sectional and plan-view TEM/STEM imaging revealed hybrid pinning structures consisting of nanorods, nanoparticles, and planar defects that were formed spontaneously. Nanorods were imaged with high spatial resolution via field-emission SEM of thin-foil specimens. Focused-ion-beam (FIB) micro-sectioning enables SEM imaging of microscale heterogeneity in nanorod spatial distributions. 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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Applied physics Composition Conductors Critical current density Foils Heterogeneity Inhomogeneity Ion beams Nanoparticles Nanorods Perovskites Pinning Pulsed laser deposition Pulsed lasers Scanning electron microscopy Scanning transmission electron microscopy Spatial distribution Spatial resolution Thin films Transmission electron microscopy YBCO superconductors |
| title | Nano- to microscale structural and compositional heterogeneity of artificial pinning centers in pulsed-laser-deposited YBa2Cu3O7−y thin films |
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