Achieving high spatial resolution in a large field-of-view using lensless x-ray imaging

X-ray ptychography, a powerful scanning lensless imaging technique, has become attractive for nondestructively imaging internal structures at nanoscale. Stage positioning overhead in conventional step-scan ptychography is one of the limiting factors on the imaging throughput. In this work, we demons...

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Veröffentlicht in:	Applied physics letters 2021-09, Vol.119 (12)
Hauptverfasser:	Jiang, Yi, Deng, Junjing, Yao, Yudong, Klug, Jeffrey A., Mashrafi, Sheikh, Roehrig, Christian, Preissner, Curt, Marin, Fabricio S., Cai, Zhonghou, Lai, Barry, Vogt, Stefan
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Field of view High resolution Imaging techniques Integrated circuits OTHER INSTRUMENTATION Spatial resolution X ray imagery
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