Impact of roughness on heat conduction involving nanocontacts

The impact of surface roughness on conductive heat transfer across nanoscale contacts is investigated by means of scanning thermal microscopy. Silicon surfaces with the out-of-plane rms roughness of ∼0, 0.5, 4, 7, and 11 nm are scanned both under air and vacuum conditions. Three types of resistive S...

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Veröffentlicht in:	Applied physics letters 2021-10, Vol.119 (16)
Hauptverfasser:	Guen, Eloïse, Chapuis, Pierre-Olivier, Kaur, Nupinder Jeet, Klapetek, Petr, Gomés, Séverine
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Conduction heating Conductive heat transfer Curvature Engineering Sciences Flat surfaces Mechanics Scanning thermal microscopy Surface roughness Thermal conductivity Thermics Thermodynamic properties
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