Scaling of quadratic and linear magneto-optic Kerr effect spectra with L21 ordering of Co2MnSi Heusler compound
Spectral ellipsometry is a useful technique allowing fast, nondestructive, and contactless characterization of thin films and constituent materials. In this Letter, we show that both the linear magneto-optic Kerr effect (LinMOKE, proportional to the magnetization M) and the quadratic MOKE (QMOKE, pr...
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creator | Silber, Robin Král, Daniel Stejskal, Ondřej Kubota, Takahide Ando, Yasuo Pištora, Jaromír Veis, Martin Hamrle, Jaroslav Kuschel, Timo |
description | Spectral ellipsometry is a useful technique allowing fast, nondestructive, and contactless characterization of thin films and constituent materials. In this Letter, we show that both the linear magneto-optic Kerr effect (LinMOKE, proportional to the magnetization M) and the quadratic MOKE (QMOKE, proportional to
M
2) can be a useful extension of spectral ellipsometry and are able to sense the crystallographic ordering of Heusler compounds. This is demonstrated for the Heusler compound Co2MnSi, which has a crystallographic transition from a B2 to an L21 structure with increasing annealing temperature Ta. We investigated a set of Co2MnSi thin films deposited on MgO(001) substrates and annealed from 300 to 500 °C. The amplitude of LinMOKE and QMOKE spectra, detected in the extended visible spectral range of 0.8–5.5 eV, scales linearly with Ta, and this effect is pronounced at the resonant peaks of the QMOKE spectra below 2.0 eV. Furthermore, the spectra of the magneto-optic (MO) parameters, which fully describe the MO response of Co2MnSi up to the second order in M, are obtained depending on Ta. Finally, the spectra are compared with ab initio calculations of a purely L21-ordered Co2MnSi Heusler compound. |
doi_str_mv | 10.1063/5.0008427 |
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M
2) can be a useful extension of spectral ellipsometry and are able to sense the crystallographic ordering of Heusler compounds. This is demonstrated for the Heusler compound Co2MnSi, which has a crystallographic transition from a B2 to an L21 structure with increasing annealing temperature Ta. We investigated a set of Co2MnSi thin films deposited on MgO(001) substrates and annealed from 300 to 500 °C. The amplitude of LinMOKE and QMOKE spectra, detected in the extended visible spectral range of 0.8–5.5 eV, scales linearly with Ta, and this effect is pronounced at the resonant peaks of the QMOKE spectra below 2.0 eV. Furthermore, the spectra of the magneto-optic (MO) parameters, which fully describe the MO response of Co2MnSi up to the second order in M, are obtained depending on Ta. Finally, the spectra are compared with ab initio calculations of a purely L21-ordered Co2MnSi Heusler compound.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0008427</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Annealing ; Applied physics ; Crystallography ; Ellipsometry ; Kerr magnetooptical effect ; Nondestructive testing ; Spectra ; Substrates ; Thin films</subject><ispartof>Applied physics letters, 2020-06, Vol.116 (26)</ispartof><rights>Author(s)</rights><rights>2020 Author(s). Published under license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c172f-4c72c0dcc1cf139b639af4a5ee19b3cf9b87eda5f69b211ae3e612aee57101923</citedby><cites>FETCH-LOGICAL-c172f-4c72c0dcc1cf139b639af4a5ee19b3cf9b87eda5f69b211ae3e612aee57101923</cites><orcidid>0000-0002-4235-8612 ; 0000-0002-4981-1977 ; 0000-0002-8873-3414 ; 0000-0002-8443-0563 ; 0000-0001-6170-7585 ; 0000-0002-9371-8876</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/5.0008427$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,4498,27901,27902,76126</link.rule.ids></links><search><creatorcontrib>Silber, Robin</creatorcontrib><creatorcontrib>Král, Daniel</creatorcontrib><creatorcontrib>Stejskal, Ondřej</creatorcontrib><creatorcontrib>Kubota, Takahide</creatorcontrib><creatorcontrib>Ando, Yasuo</creatorcontrib><creatorcontrib>Pištora, Jaromír</creatorcontrib><creatorcontrib>Veis, Martin</creatorcontrib><creatorcontrib>Hamrle, Jaroslav</creatorcontrib><creatorcontrib>Kuschel, Timo</creatorcontrib><title>Scaling of quadratic and linear magneto-optic Kerr effect spectra with L21 ordering of Co2MnSi Heusler compound</title><title>Applied physics letters</title><description>Spectral ellipsometry is a useful technique allowing fast, nondestructive, and contactless characterization of thin films and constituent materials. In this Letter, we show that both the linear magneto-optic Kerr effect (LinMOKE, proportional to the magnetization M) and the quadratic MOKE (QMOKE, proportional to
M
2) can be a useful extension of spectral ellipsometry and are able to sense the crystallographic ordering of Heusler compounds. This is demonstrated for the Heusler compound Co2MnSi, which has a crystallographic transition from a B2 to an L21 structure with increasing annealing temperature Ta. We investigated a set of Co2MnSi thin films deposited on MgO(001) substrates and annealed from 300 to 500 °C. The amplitude of LinMOKE and QMOKE spectra, detected in the extended visible spectral range of 0.8–5.5 eV, scales linearly with Ta, and this effect is pronounced at the resonant peaks of the QMOKE spectra below 2.0 eV. Furthermore, the spectra of the magneto-optic (MO) parameters, which fully describe the MO response of Co2MnSi up to the second order in M, are obtained depending on Ta. Finally, the spectra are compared with ab initio calculations of a purely L21-ordered Co2MnSi Heusler compound.</description><subject>Annealing</subject><subject>Applied physics</subject><subject>Crystallography</subject><subject>Ellipsometry</subject><subject>Kerr magnetooptical effect</subject><subject>Nondestructive testing</subject><subject>Spectra</subject><subject>Substrates</subject><subject>Thin films</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp9kEFLAzEQhYMoWKsH_0HAk8LWTNLd7R6lqBUrHqrnkM1O6pZ2s052Ff-9KS16EJzDDPPm4w08xs5BjEBk6jodCSEmY5kfsAGIPE8UwOSQDaKqkqxI4ZidhLCKayqVGjC_sGZdN0vuHX_vTUWmqy03TcWjiob4xiwb7Hzi2-3hEYk4Ooe246GNnQz_rLs3PpfAPVVIe6-pl0_NouYz7MMaiVu_aX3fVKfsyJl1wLP9HLLXu9uX6SyZP98_TG_miYVcumRsc2lFZS1YB6ooM1UYNzYpIhSlsq4oJzlWJnVZUUoAgwozkAYxzUFAIdWQXex8W_LvPYZOr3xPTXyp5RhiQFmsSF3uKEs-BEKnW6o3hr40CL3NU6d6n2dkr3ZssHUXU_LND_zh6RfUbeX-g_86fwOWQIPX</recordid><startdate>20200629</startdate><enddate>20200629</enddate><creator>Silber, Robin</creator><creator>Král, Daniel</creator><creator>Stejskal, Ondřej</creator><creator>Kubota, Takahide</creator><creator>Ando, Yasuo</creator><creator>Pištora, Jaromír</creator><creator>Veis, Martin</creator><creator>Hamrle, Jaroslav</creator><creator>Kuschel, Timo</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-4235-8612</orcidid><orcidid>https://orcid.org/0000-0002-4981-1977</orcidid><orcidid>https://orcid.org/0000-0002-8873-3414</orcidid><orcidid>https://orcid.org/0000-0002-8443-0563</orcidid><orcidid>https://orcid.org/0000-0001-6170-7585</orcidid><orcidid>https://orcid.org/0000-0002-9371-8876</orcidid></search><sort><creationdate>20200629</creationdate><title>Scaling of quadratic and linear magneto-optic Kerr effect spectra with L21 ordering of Co2MnSi Heusler compound</title><author>Silber, Robin ; Král, Daniel ; Stejskal, Ondřej ; Kubota, Takahide ; Ando, Yasuo ; Pištora, Jaromír ; Veis, Martin ; Hamrle, Jaroslav ; Kuschel, Timo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c172f-4c72c0dcc1cf139b639af4a5ee19b3cf9b87eda5f69b211ae3e612aee57101923</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Annealing</topic><topic>Applied physics</topic><topic>Crystallography</topic><topic>Ellipsometry</topic><topic>Kerr magnetooptical effect</topic><topic>Nondestructive testing</topic><topic>Spectra</topic><topic>Substrates</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Silber, Robin</creatorcontrib><creatorcontrib>Král, Daniel</creatorcontrib><creatorcontrib>Stejskal, Ondřej</creatorcontrib><creatorcontrib>Kubota, Takahide</creatorcontrib><creatorcontrib>Ando, Yasuo</creatorcontrib><creatorcontrib>Pištora, Jaromír</creatorcontrib><creatorcontrib>Veis, Martin</creatorcontrib><creatorcontrib>Hamrle, Jaroslav</creatorcontrib><creatorcontrib>Kuschel, Timo</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Silber, Robin</au><au>Král, Daniel</au><au>Stejskal, Ondřej</au><au>Kubota, Takahide</au><au>Ando, Yasuo</au><au>Pištora, Jaromír</au><au>Veis, Martin</au><au>Hamrle, Jaroslav</au><au>Kuschel, Timo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scaling of quadratic and linear magneto-optic Kerr effect spectra with L21 ordering of Co2MnSi Heusler compound</atitle><jtitle>Applied physics letters</jtitle><date>2020-06-29</date><risdate>2020</risdate><volume>116</volume><issue>26</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Spectral ellipsometry is a useful technique allowing fast, nondestructive, and contactless characterization of thin films and constituent materials. In this Letter, we show that both the linear magneto-optic Kerr effect (LinMOKE, proportional to the magnetization M) and the quadratic MOKE (QMOKE, proportional to
M
2) can be a useful extension of spectral ellipsometry and are able to sense the crystallographic ordering of Heusler compounds. This is demonstrated for the Heusler compound Co2MnSi, which has a crystallographic transition from a B2 to an L21 structure with increasing annealing temperature Ta. We investigated a set of Co2MnSi thin films deposited on MgO(001) substrates and annealed from 300 to 500 °C. The amplitude of LinMOKE and QMOKE spectra, detected in the extended visible spectral range of 0.8–5.5 eV, scales linearly with Ta, and this effect is pronounced at the resonant peaks of the QMOKE spectra below 2.0 eV. Furthermore, the spectra of the magneto-optic (MO) parameters, which fully describe the MO response of Co2MnSi up to the second order in M, are obtained depending on Ta. Finally, the spectra are compared with ab initio calculations of a purely L21-ordered Co2MnSi Heusler compound.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0008427</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-4235-8612</orcidid><orcidid>https://orcid.org/0000-0002-4981-1977</orcidid><orcidid>https://orcid.org/0000-0002-8873-3414</orcidid><orcidid>https://orcid.org/0000-0002-8443-0563</orcidid><orcidid>https://orcid.org/0000-0001-6170-7585</orcidid><orcidid>https://orcid.org/0000-0002-9371-8876</orcidid></addata></record> |
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subjects | Annealing Applied physics Crystallography Ellipsometry Kerr magnetooptical effect Nondestructive testing Spectra Substrates Thin films |
title | Scaling of quadratic and linear magneto-optic Kerr effect spectra with L21 ordering of Co2MnSi Heusler compound |
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