Experimental evaluation of low-frequency oscillations in undoped GaAs to probe deep level parameters

A new method for characterizing undoped, semi-insulating GaAs is presented. The low-frequency current oscillations on undoped liquid encapsulated Czochralski GaAs substrates are used to determine deep level energies, cross sections, and concentrations. A Fourier transform is used to resolve the vari...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Applied physics letters 1985-02, Vol.46 (3), p.305-307
Hauptverfasser:	MARACAS, G. N, JOHNSON, D. A, GORONKIN, H
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron states Exact sciences and technology Impurity and defect levels Physics
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!