Interface recombination and carrier confinement at a GaAs/Ga x In1− x P double heterojunction studied by picosecond population modulation spectroscopy

Sensitive picosecond excite-probe modulation methods have been applied to study electron-hole confinement and interface lifetime in a molecular beam epitaxy (MBE) grown n-type GaxIn1−xP/ GaAs/GaxIn1−xP double heterojunction. Time-varying transmission spectra at 77 K have been examined near the E0+Δ0...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 1982-05, Vol.40 (10), p.885-887
Hauptverfasser: Harris, J. H., Sugai, S., Nurmikko, A. V.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!