Gamma−ray spectroscopy with single−carrier collection in high−resistivity semiconductors

With the standard plane−parallel configuration of semiconductor detectors, good γ−ray spectra can only be obtained when both electrons and holes are completely collected. We show by calculations (and experiments) that with contacts of hemispherical configuration one can obtain γ−ray spectra of adequ...

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Veröffentlicht in:Appl. Phys. Lett., v. 26, no. 6, pp. 344-346 v. 26, no. 6, pp. 344-346, 1975-03, Vol.26 (6), p.344-346
Hauptverfasser: Malm, H. L., Canali, C., Mayer, J. W., Nicolet, M−A., Zanio, K. R., Akutagawa, W.
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container_end_page 346
container_issue 6
container_start_page 344
container_title Appl. Phys. Lett., v. 26, no. 6, pp. 344-346
container_volume 26
creator Malm, H. L.
Canali, C.
Mayer, J. W.
Nicolet, M−A.
Zanio, K. R.
Akutagawa, W.
description With the standard plane−parallel configuration of semiconductor detectors, good γ−ray spectra can only be obtained when both electrons and holes are completely collected. We show by calculations (and experiments) that with contacts of hemispherical configuration one can obtain γ−ray spectra of adequate resolution and with signal heights of nearly full amplitude even when only one type of carrier is collected. Experiments with CdTe detectors for which the μτ product for electrons is about 103 times that of the holes confirm these calculations. The adoption of hemispherical contacts thus widens the range of high−resistivity semiconductors potentially acceptable for γ−ray detection at room temperature.
doi_str_mv 10.1063/1.88158
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ispartof Appl. Phys. Lett., v. 26, no. 6, pp. 344-346, 1975-03, Vol.26 (6), p.344-346
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1077-3118
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subjects CARRIER LIFETIME
CDTE SEMICONDUCTOR DETECTORS- CHARGE COLLECTION
ELECTRIC CONTACTS
ENERGY RESOLUTION
GAMMA DETECTION
GAMMA SPECTRA
GAMMA SPECTROMETERS- CDTE SEMICONDUCTOR DETECTORS
GAMMA SPECTROSCOPY
N46130 -Instrumentation-Radiation Detection Instruments- Nuclear Spectroscopic Instrumentation
title Gamma−ray spectroscopy with single−carrier collection in high−resistivity semiconductors
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