Analytical modeling of k 33 mode partial electrode configuration for loss characterization

Accurate determination of three types of losses (dielectric, elastic, and piezoelectric) in piezoelectric materials is critical, since they are closely related to the performance of high-power piezoelectric devices. The standard k33 mode has a number of serious deficits that hinder researchers from...

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Veröffentlicht in:	Journal of applied physics 2020-05, Vol.127 (20)
Hauptverfasser:	Park, Yoonsang, Majzoubi, Maryam, Zhang, Yuxuan, Scholehwar, Timo, Hennig, Eberhard, Uchino, Kenji
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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