A method for analyzing two-dimensional lithium ion concentration in the nano silicon films
With the variation of thickness and composition, the color of the nanosilicon film electrode in lithium ion batteries would be changed during lithium ion intercalation and deintercalation. Based on such phenomenon, here we present a method for evaluating the two-dimensional lithium ion concentration...
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| Veröffentlicht in: | Applied physics letters 2019-12, Vol.115 (26) |
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| container_issue | 26 |
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| container_title | Applied physics letters |
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| creator | Chen, Hao-Sen Han, Yu Yang, Le Bao, Yin-Hua Chen, Jian Li, Xiang Pang, Jing Song, Wei-Li Fang, Dai-Ning |
| description | With the variation of thickness and composition, the color of the nanosilicon film electrode in lithium ion batteries would be changed during lithium ion intercalation and deintercalation. Based on such phenomenon, here we present a method for evaluating the two-dimensional lithium ion concentration in the nanosilicon film. In the demonstration of a silicon film with thickness ∼115 nm, the correlation between tristimulus values and lithium ion concentration is established. In a piece of a large silicon film, the inhomogeneous lithium ion concentration could be obtained, highlighting a fast and noncontact method for in situ observation and analyses of the kinetic process of ion intercalation and deintercalation in nanosilicon films. |
| doi_str_mv | 10.1063/1.5132578 |
| format | Article |
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Based on such phenomenon, here we present a method for evaluating the two-dimensional lithium ion concentration in the nanosilicon film. In the demonstration of a silicon film with thickness ∼115 nm, the correlation between tristimulus values and lithium ion concentration is established. In a piece of a large silicon film, the inhomogeneous lithium ion concentration could be obtained, highlighting a fast and noncontact method for in situ observation and analyses of the kinetic process of ion intercalation and deintercalation in nanosilicon films.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.5132578</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Intercalation ; Ion concentration ; Ions ; Lithium ; Lithium-ion batteries ; Rechargeable batteries ; Silicon films ; Thickness ; Two dimensional analysis</subject><ispartof>Applied physics letters, 2019-12, Vol.115 (26)</ispartof><rights>Author(s)</rights><rights>2019 Author(s). 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Based on such phenomenon, here we present a method for evaluating the two-dimensional lithium ion concentration in the nanosilicon film. In the demonstration of a silicon film with thickness ∼115 nm, the correlation between tristimulus values and lithium ion concentration is established. In a piece of a large silicon film, the inhomogeneous lithium ion concentration could be obtained, highlighting a fast and noncontact method for in situ observation and analyses of the kinetic process of ion intercalation and deintercalation in nanosilicon films.</description><subject>Applied physics</subject><subject>Intercalation</subject><subject>Ion concentration</subject><subject>Ions</subject><subject>Lithium</subject><subject>Lithium-ion batteries</subject><subject>Rechargeable batteries</subject><subject>Silicon films</subject><subject>Thickness</subject><subject>Two dimensional analysis</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLAzEUhYMoWKsL_0HAlcLUPGcmy1J8QcGNbtyEzCSxKTNJTVKl_nqntuhCcHU5934c7jkAnGM0waik13jCMSW8qg_ACKOqKijG9SEYIYRoUQqOj8FJSstBckLpCLxMYW_yImhoQ4TKq27z6fwrzB-h0K43PrkwLGHn8sKtezgo2AbfGp-jylvlPMwLA73yASbXueEKrev6dAqOrOqSOdvPMXi-vXma3Rfzx7uH2XRetJRUuSAKWcQ4E6XVZcuqVldK1NaYpmFY0IYxQ7XQqmXcaMIEUUpzJTirG8zKsqJjcLHzXcXwtjYpy2VYx-HpJAklQtSMVfVAXe6oNoaUorFyFV2v4kZiJLfVSSz31Q3s1Y5NrcvfKX_g9xB_QbnS9j_4r_MX5xx9aA</recordid><startdate>20191223</startdate><enddate>20191223</enddate><creator>Chen, Hao-Sen</creator><creator>Han, Yu</creator><creator>Yang, Le</creator><creator>Bao, Yin-Hua</creator><creator>Chen, Jian</creator><creator>Li, Xiang</creator><creator>Pang, Jing</creator><creator>Song, Wei-Li</creator><creator>Fang, Dai-Ning</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20191223</creationdate><title>A method for analyzing two-dimensional lithium ion concentration in the nano silicon films</title><author>Chen, Hao-Sen ; Han, Yu ; Yang, Le ; Bao, Yin-Hua ; Chen, Jian ; Li, Xiang ; Pang, Jing ; Song, Wei-Li ; Fang, Dai-Ning</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c327t-2a0f045496fd6c47cd7a98feebb4193b44e3d9dac45ed2492aad5a9548b146673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Applied physics</topic><topic>Intercalation</topic><topic>Ion concentration</topic><topic>Ions</topic><topic>Lithium</topic><topic>Lithium-ion batteries</topic><topic>Rechargeable batteries</topic><topic>Silicon films</topic><topic>Thickness</topic><topic>Two dimensional analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chen, Hao-Sen</creatorcontrib><creatorcontrib>Han, Yu</creatorcontrib><creatorcontrib>Yang, Le</creatorcontrib><creatorcontrib>Bao, Yin-Hua</creatorcontrib><creatorcontrib>Chen, Jian</creatorcontrib><creatorcontrib>Li, Xiang</creatorcontrib><creatorcontrib>Pang, Jing</creatorcontrib><creatorcontrib>Song, Wei-Li</creatorcontrib><creatorcontrib>Fang, Dai-Ning</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chen, Hao-Sen</au><au>Han, Yu</au><au>Yang, Le</au><au>Bao, Yin-Hua</au><au>Chen, Jian</au><au>Li, Xiang</au><au>Pang, Jing</au><au>Song, Wei-Li</au><au>Fang, Dai-Ning</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A method for analyzing two-dimensional lithium ion concentration in the nano silicon films</atitle><jtitle>Applied physics letters</jtitle><date>2019-12-23</date><risdate>2019</risdate><volume>115</volume><issue>26</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>With the variation of thickness and composition, the color of the nanosilicon film electrode in lithium ion batteries would be changed during lithium ion intercalation and deintercalation. Based on such phenomenon, here we present a method for evaluating the two-dimensional lithium ion concentration in the nanosilicon film. In the demonstration of a silicon film with thickness ∼115 nm, the correlation between tristimulus values and lithium ion concentration is established. In a piece of a large silicon film, the inhomogeneous lithium ion concentration could be obtained, highlighting a fast and noncontact method for in situ observation and analyses of the kinetic process of ion intercalation and deintercalation in nanosilicon films.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5132578</doi><tpages>5</tpages></addata></record> |
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| ispartof | Applied physics letters, 2019-12, Vol.115 (26) |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Applied physics Intercalation Ion concentration Ions Lithium Lithium-ion batteries Rechargeable batteries Silicon films Thickness Two dimensional analysis |
| title | A method for analyzing two-dimensional lithium ion concentration in the nano silicon films |
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