Electronic transport and spatial current patterns of 2D electronic system: A recursive Green’s function method study

Based on the scanned probe microscopes, the local current properties in a nanodevice can be clearly exposed. However, it is still a big challenge to experimentally observe the atomic scale varying current pattern. A numerical-aided method is therefore very important for getting the local current inf...

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Veröffentlicht in:	AIP advances 2019-11, Vol.9 (11), p.115209-115209-9
Hauptverfasser:	Zhang, X. W., Liu, Y. L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Contact potentials Electron transport Local current Mathematical analysis Microscopes Nanotechnology devices Point contact Recursive functions Recursive methods Resistance Saddle points Transport properties
Online-Zugang:	Volltext
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