FIB lift-out of conducting ferroelectric domain walls in hexagonal manganites

A focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined charge states, enabling accurate studies of their intrinsic physical prope...

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Veröffentlicht in:	Applied physics letters 2019-09, Vol.115 (12), p.122901
Hauptverfasser:	Mosberg, Aleksander B., Roede, Erik D., Evans, Donald M., Holstad, Theodor S., Bourret, Edith, Yan, Zewu, van Helvoort, Antonius T. J., Meier, Dennis
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Atomic force microscopy Correlation analysis Domain walls Electron transport Ferroelectric domains Ferroelectric materials Ferroelectricity Ion beams Lamella Magnetism Manganites Optimization Physical properties
Online-Zugang:	Volltext
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