In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements
We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and tran...
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| Veröffentlicht in: | Review of scientific instruments 2019-07, Vol.90 (7), p.073105-073105 |
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| container_title | Review of scientific instruments |
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| creator | Zeeshan, F. Hoszowska, J. Loperetti-Tornay, L. Dousse, J.-Cl |
| description | We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the Cu K-edge and Ta L3-edge XAFS spectra obtained in-house with the corresponding spectra measured at a synchrotron radiation facility. To check the accuracy of the device, the K- and L-edge energies and the attenuation coefficients below and above the edges of several 3d, 4d, and 5d elements were determined and compared with the existing experimental and theoretical data. The dependence of the XAFS spectrum shape on the oxidation state of the sample was also probed by measuring inhouse the absorption spectra of metallic Fe and two Fe oxides (Fe2O3 and Fe3O4). |
| doi_str_mv | 10.1063/1.5094873 |
| format | Article |
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The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the Cu K-edge and Ta L3-edge XAFS spectra obtained in-house with the corresponding spectra measured at a synchrotron radiation facility. To check the accuracy of the device, the K- and L-edge energies and the attenuation coefficients below and above the edges of several 3d, 4d, and 5d elements were determined and compared with the existing experimental and theoretical data. 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The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the Cu K-edge and Ta L3-edge XAFS spectra obtained in-house with the corresponding spectra measured at a synchrotron radiation facility. To check the accuracy of the device, the K- and L-edge energies and the attenuation coefficients below and above the edges of several 3d, 4d, and 5d elements were determined and compared with the existing experimental and theoretical data. The dependence of the XAFS spectrum shape on the oxidation state of the sample was also probed by measuring inhouse the absorption spectra of metallic Fe and two Fe oxides (Fe2O3 and Fe3O4).</description><subject>Absorption spectra</subject><subject>Attenuation coefficients</subject><subject>Dependence</subject><subject>Fine structure</subject><subject>Iron oxides</subject><subject>Laboratories</subject><subject>Oxidation</subject><subject>Reliability analysis</subject><subject>Scientific apparatus & instruments</subject><subject>Spectrum analysis</subject><subject>Synchrotron radiation</subject><subject>Tantalum</subject><subject>Valence</subject><subject>X ray absorption</subject><subject>X ray sources</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp90F1LwzAUBuAgipvTC_-AFLxRoTOnyZL2UoZfMPBGL6Wk-cCOtalJKvbfm7E5QcHcJIQnJ-e8CJ0CngJm5BqmM1zQnJM9NAacFylnGdlHY4wJTRmn-Qgdeb_Ecc0ADtGIAOGYMjxGr49t-mZ7rxOvQ98lxrpkJSrrRLBuSCvhtUo-UyeGRFTeui7Utk1M3cYHwfUy9C6eOi2Ds17abkgaLXy8bHQb_DE6MGLl9cl2n6CXu9vn-UO6eLp_nN8sUkkhD2lGDaskjQ3NRK6YAOBEVqbgM5ZxBXmciRaGK2yYVJTlpiqUKgwhRFWgsCYTdLGp2zn73msfyqb2Uq9WotVxuDLLWE6AQlZEev6LLm3v2tjdWjFeEAAW1eVGyTiWd9qUnasb4YYScLnOvIRym3m0Z9uKfdVotZPfIUdwtQFe1kGsA9yZD-t-KpWdMv_hv19_AUsVmGU</recordid><startdate>201907</startdate><enddate>201907</enddate><creator>Zeeshan, F.</creator><creator>Hoszowska, J.</creator><creator>Loperetti-Tornay, L.</creator><creator>Dousse, J.-Cl</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-4075-343X</orcidid><orcidid>https://orcid.org/0000-0003-0366-7436</orcidid><orcidid>https://orcid.org/000000034075343X</orcidid><orcidid>https://orcid.org/0000000303667436</orcidid></search><sort><creationdate>201907</creationdate><title>In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements</title><author>Zeeshan, F. ; Hoszowska, J. ; Loperetti-Tornay, L. ; Dousse, J.-Cl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c418t-24f6bc44605a8d6a1173cbf975627d1810849f7d0f6cd468fb9dd9f333db1d0e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Absorption spectra</topic><topic>Attenuation coefficients</topic><topic>Dependence</topic><topic>Fine structure</topic><topic>Iron oxides</topic><topic>Laboratories</topic><topic>Oxidation</topic><topic>Reliability analysis</topic><topic>Scientific apparatus & instruments</topic><topic>Spectrum analysis</topic><topic>Synchrotron radiation</topic><topic>Tantalum</topic><topic>Valence</topic><topic>X ray absorption</topic><topic>X ray sources</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zeeshan, F.</creatorcontrib><creatorcontrib>Hoszowska, J.</creatorcontrib><creatorcontrib>Loperetti-Tornay, L.</creatorcontrib><creatorcontrib>Dousse, J.-Cl</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zeeshan, F.</au><au>Hoszowska, J.</au><au>Loperetti-Tornay, L.</au><au>Dousse, J.-Cl</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2019-07</date><risdate>2019</risdate><volume>90</volume><issue>7</issue><spage>073105</spage><epage>073105</epage><pages>073105-073105</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We report on a laboratory-based facility for in-house x-ray absorption fine structure (XAFS) measurements. The device consists of a conventional x-ray source for the production of the incident polychromatic radiation and a von Hamos bent crystal spectrometer for the analysis of the incoming and transmitted radiation. The reliability of the laboratory-based setup was evaluated by comparing the Cu K-edge and Ta L3-edge XAFS spectra obtained in-house with the corresponding spectra measured at a synchrotron radiation facility. To check the accuracy of the device, the K- and L-edge energies and the attenuation coefficients below and above the edges of several 3d, 4d, and 5d elements were determined and compared with the existing experimental and theoretical data. 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| ispartof | Review of scientific instruments, 2019-07, Vol.90 (7), p.073105-073105 |
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| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Absorption spectra Attenuation coefficients Dependence Fine structure Iron oxides Laboratories Oxidation Reliability analysis Scientific apparatus & instruments Spectrum analysis Synchrotron radiation Tantalum Valence X ray absorption X ray sources |
| title | In-house setup for laboratory-based x-ray absorption fine structure spectroscopy measurements |
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