TiNx/Hf0.5Zr0.5O2/TiNx ferroelectric memory with tunable transparency and suppressed wake-up effect

The discovery of HfO2-based ferroelectric (FE) films gives FE memory devices great potential for the next-generation memory technology. In this letter, TiNx with varying nitrogen atomic contents was demonstrated as electrodes of FE Hf0.5Zr0.5O2 memory devices on quartz substrates for transparent mem...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2019-02, Vol.114 (5)
Hauptverfasser: Li, Yuxing, Liang, Renrong, Xiong, Benkuan, Liu, Houfang, Zhao, Ruiting, Li, Jingzhou, Liu, Ting, Pang, Yu, Tian, He, Yang, Yi, Ren, Tian-Ling
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!