Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy

The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2019-04, Vol.114 (16)
Hauptverfasser: Niu, Quan, Wetzelaer, Gert-Jan A. H., Blom, Paul W. M., Irina Crăciun, N.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!