Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy
The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since th...
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| Veröffentlicht in: | Applied physics letters 2019-04, Vol.114 (16) |
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| container_title | Applied physics letters |
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| creator | Niu, Quan Wetzelaer, Gert-Jan A. H. Blom, Paul W. M. Irina Crăciun, N. |
| description | The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since the relaxation time scales with the (inverse) concentration of traps, impedance spectroscopy measurements allow for a quantitative determination of the amount of traps formed during degradation. We demonstrate that the obtained hole trap concentration is in agreement with the amount found by numerically modeling the increase in the PLED driving voltage. Impedance spectroscopy measurements are therefore useful as an in-situ characterization tool during PLED degradation, providing information on trap formation without numerical device modeling. |
| doi_str_mv | 10.1063/1.5083036 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_5083036</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2214493989</sourcerecordid><originalsourceid>FETCH-LOGICAL-c362t-e043bddf5691ff05506e1efd7c8418f4c36d5335263d3efe7481baaf0f15c57a3</originalsourceid><addsrcrecordid>eNp9kE1LAzEQhoMoWKsH_0HAk8LWZLPZj6MUv6Aggp6XNJm0KbubmGSF_nvTVvQgeJoZ5uGZ4UXokpIZJSW7pTNOakZYeYQmlFRVxiitj9GEEMKysuH0FJ2FsEkjzxmbIPc6iiEabaSIxg7Yary2HWTRC4elHSQMqd2vzIAVrLxQoLCz3bYHjzuzWscMehOjGVZYGasg4DHsBtM7UCIZcHAgo7dBWrc9RydadAEuvusUvT_cv82fssXL4_P8bpFJVuZJSQq2VErzsqFaE85JCRS0qmRd0FoXiVKcMZ6XTDHQUBU1XQqhiaZc8kqwKbo6eJ23HyOE2G7s6Id0ss1zWhQNa-omUdcHSqb3ggfdOm964bctJe0u0Ja234Em9ubABmniPpIf-NP6X7B1Sv8H_zV_ARPChno</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2214493989</pqid></control><display><type>article</type><title>Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy</title><source>American Institute of Physics (AIP) Journals</source><source>Alma/SFX Local Collection</source><creator>Niu, Quan ; Wetzelaer, Gert-Jan A. H. ; Blom, Paul W. M. ; Irina Crăciun, N.</creator><creatorcontrib>Niu, Quan ; Wetzelaer, Gert-Jan A. H. ; Blom, Paul W. M. ; Irina Crăciun, N.</creatorcontrib><description>The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since the relaxation time scales with the (inverse) concentration of traps, impedance spectroscopy measurements allow for a quantitative determination of the amount of traps formed during degradation. We demonstrate that the obtained hole trap concentration is in agreement with the amount found by numerically modeling the increase in the PLED driving voltage. Impedance spectroscopy measurements are therefore useful as an in-situ characterization tool during PLED degradation, providing information on trap formation without numerical device modeling.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.5083036</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Frequency response ; Hole traps ; Impedance spectroscopy ; Light emitting diodes ; Mathematical models ; Organic light emitting diodes ; Photodegradation ; Polymers ; Relaxation time ; Spectroscopic analysis ; Spectrum analysis</subject><ispartof>Applied physics letters, 2019-04, Vol.114 (16)</ispartof><rights>Author(s)</rights><rights>2019 Author(s). Published under license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c362t-e043bddf5691ff05506e1efd7c8418f4c36d5335263d3efe7481baaf0f15c57a3</citedby><cites>FETCH-LOGICAL-c362t-e043bddf5691ff05506e1efd7c8418f4c36d5335263d3efe7481baaf0f15c57a3</cites><orcidid>0000-0002-6474-9497</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.5083036$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,4498,27901,27902,76127</link.rule.ids></links><search><creatorcontrib>Niu, Quan</creatorcontrib><creatorcontrib>Wetzelaer, Gert-Jan A. H.</creatorcontrib><creatorcontrib>Blom, Paul W. M.</creatorcontrib><creatorcontrib>Irina Crăciun, N.</creatorcontrib><title>Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy</title><title>Applied physics letters</title><description>The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since the relaxation time scales with the (inverse) concentration of traps, impedance spectroscopy measurements allow for a quantitative determination of the amount of traps formed during degradation. We demonstrate that the obtained hole trap concentration is in agreement with the amount found by numerically modeling the increase in the PLED driving voltage. Impedance spectroscopy measurements are therefore useful as an in-situ characterization tool during PLED degradation, providing information on trap formation without numerical device modeling.</description><subject>Applied physics</subject><subject>Frequency response</subject><subject>Hole traps</subject><subject>Impedance spectroscopy</subject><subject>Light emitting diodes</subject><subject>Mathematical models</subject><subject>Organic light emitting diodes</subject><subject>Photodegradation</subject><subject>Polymers</subject><subject>Relaxation time</subject><subject>Spectroscopic analysis</subject><subject>Spectrum analysis</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEQhoMoWKsH_0HAk8LWZLPZj6MUv6Aggp6XNJm0KbubmGSF_nvTVvQgeJoZ5uGZ4UXokpIZJSW7pTNOakZYeYQmlFRVxiitj9GEEMKysuH0FJ2FsEkjzxmbIPc6iiEabaSIxg7Yary2HWTRC4elHSQMqd2vzIAVrLxQoLCz3bYHjzuzWscMehOjGVZYGasg4DHsBtM7UCIZcHAgo7dBWrc9RydadAEuvusUvT_cv82fssXL4_P8bpFJVuZJSQq2VErzsqFaE85JCRS0qmRd0FoXiVKcMZ6XTDHQUBU1XQqhiaZc8kqwKbo6eJ23HyOE2G7s6Id0ss1zWhQNa-omUdcHSqb3ggfdOm964bctJe0u0Ja234Em9ubABmniPpIf-NP6X7B1Sv8H_zV_ARPChno</recordid><startdate>20190422</startdate><enddate>20190422</enddate><creator>Niu, Quan</creator><creator>Wetzelaer, Gert-Jan A. H.</creator><creator>Blom, Paul W. M.</creator><creator>Irina Crăciun, N.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-6474-9497</orcidid></search><sort><creationdate>20190422</creationdate><title>Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy</title><author>Niu, Quan ; Wetzelaer, Gert-Jan A. H. ; Blom, Paul W. M. ; Irina Crăciun, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-e043bddf5691ff05506e1efd7c8418f4c36d5335263d3efe7481baaf0f15c57a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Applied physics</topic><topic>Frequency response</topic><topic>Hole traps</topic><topic>Impedance spectroscopy</topic><topic>Light emitting diodes</topic><topic>Mathematical models</topic><topic>Organic light emitting diodes</topic><topic>Photodegradation</topic><topic>Polymers</topic><topic>Relaxation time</topic><topic>Spectroscopic analysis</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Niu, Quan</creatorcontrib><creatorcontrib>Wetzelaer, Gert-Jan A. H.</creatorcontrib><creatorcontrib>Blom, Paul W. M.</creatorcontrib><creatorcontrib>Irina Crăciun, N.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Niu, Quan</au><au>Wetzelaer, Gert-Jan A. H.</au><au>Blom, Paul W. M.</au><au>Irina Crăciun, N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy</atitle><jtitle>Applied physics letters</jtitle><date>2019-04-22</date><risdate>2019</risdate><volume>114</volume><issue>16</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The degradation of polymer light-emitting diodes (PLEDs) under current stress is governed by the formation of hole traps. The presence of traps is reflected in the low-frequency response of PLEDs by a negative contribution to the capacitance that originates from trap-assisted recombination. Since the relaxation time scales with the (inverse) concentration of traps, impedance spectroscopy measurements allow for a quantitative determination of the amount of traps formed during degradation. We demonstrate that the obtained hole trap concentration is in agreement with the amount found by numerically modeling the increase in the PLED driving voltage. Impedance spectroscopy measurements are therefore useful as an in-situ characterization tool during PLED degradation, providing information on trap formation without numerical device modeling.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5083036</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-6474-9497</orcidid><oa>free_for_read</oa></addata></record> |
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| source | American Institute of Physics (AIP) Journals; Alma/SFX Local Collection |
| subjects | Applied physics Frequency response Hole traps Impedance spectroscopy Light emitting diodes Mathematical models Organic light emitting diodes Photodegradation Polymers Relaxation time Spectroscopic analysis Spectrum analysis |
| title | Quantification of hole-trap concentration in degraded polymer light-emitting diodes using impedance spectroscopy |
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