Frontiers of magnetic force microscopy

Since it was first demonstrated in 1987, magnetic force microscopy (MFM) has become a truly widespread and commonly used characterization technique that has been applied to a variety of research and industrial applications. Some of the main advantages of the method includes its high spatial resoluti...

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Bibliographische Detailangaben

Veröffentlicht in:	Journal of applied physics 2019-02, Vol.125 (6)
Hauptverfasser:	Kazakova, O., Puttock, R., Barton, C., Corte-León, H., Jaafar, M., Neu, V., Asenjo, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Ferromagnetic materials Hypothetical particles Industrial applications Instruments Insulators Magnetic fields Magnetic force microscopy Materials science Microscopy Particle theory Spatial resolution Thin films
Online-Zugang:	Volltext
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