Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection

Scanning electron microscopy with polarization analysis is a powerful lab-based magnetic imaging technique offering simultaneous imaging of multiple magnetization components and a very high spatial resolution. However, one drawback of the technique is the long required acquisition time resulting fro...

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Veröffentlicht in:	Review of scientific instruments 2018-08, Vol.89 (8), p.083703-083703
Hauptverfasser:	Schönke, Daniel, Oelsner, Andreas, Krautscheid, Pascal, Reeve, Robert M., Kläui, Mathias
Format:	Artikel
Sprache:	eng
Schlagworte:	Converters Digital imaging Magnetic structure Polarization Scanning electron microscopy Scientific apparatus & instruments Spatial resolution Windows (intervals)
Online-Zugang:	Volltext
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