The effect of structural disorder on the secondary electron emission of graphite

The dependance of the secondary electron yield (SEY) on the degree of crystallinity of graphite has been investigated during the amorphization of a highly oriented pyrolytic graphite (HOPG) samples by means of Ar+ bombardment. Photoemission and Raman spectroscopies were used to follow the structural...

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Veröffentlicht in:	AIP advances 2016-09, Vol.6 (9), p.095117-095117-6
Hauptverfasser:	Gonzalez, L. A., Larciprete, R., Cimino, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphization Bombardment Crystal defects Degree of crystallinity Electron emission Electron transport Electrons Graphite Microstructure Photoelectric emission Property damage Pyrolytic graphite Raman spectroscopy Spectrum analysis Structural damage Surface layers Valence band
Online-Zugang:	Volltext
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