Electrical properties of Ge crystals and effective Schottky barrier height of NiGe/Ge junctions modified by P and chalcogen (S, Se, or Te) co-doping

The electrical properties of Ge crystals and the effective Schottky barrier height (SBH) of NiGe/Ge diodes fabricated by P and/or chalcogen (S, Se, or Te) doping were investigated for Ge n-channel metal–oxide–semiconductor field-effect transistors with a NiGe/n +Ge junction. The electron concentrati...

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Veröffentlicht in:Applied physics letters 2016-09, Vol.109 (10)
Hauptverfasser: Koike, Masahiro, Kamimuta, Yuuichi, Tezuka, Tsutomu, Yamabe, Kikuo
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container_title Applied physics letters
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Kamimuta, Yuuichi
Tezuka, Tsutomu
Yamabe, Kikuo
description The electrical properties of Ge crystals and the effective Schottky barrier height (SBH) of NiGe/Ge diodes fabricated by P and/or chalcogen (S, Se, or Te) doping were investigated for Ge n-channel metal–oxide–semiconductor field-effect transistors with a NiGe/n +Ge junction. The electron concentration in Ge was increased more by co-doping with chalcogen and P than by doping with P alone. Moreover, SBH values were decreased in NiGe/nGe diodes and increased in NiGe/pGe diodes compared with undoped NiGe/Ge by both P doping and P and chalcogen co-doping. Co-doping with Te and P was most effective in modifying the SBH.
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subjects Applied physics
Diodes
Doping
Electrical junctions
Electrical properties
Field effect transistors
Germanides
Germanium
Intermetallic compounds
MOSFETs
Nickel compounds
Semiconductor devices
Tellurium
title Electrical properties of Ge crystals and effective Schottky barrier height of NiGe/Ge junctions modified by P and chalcogen (S, Se, or Te) co-doping
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