Modelling of electron beam induced nanowire attraction

Scanning electron microscope (SEM) induced nanowire (NW) attraction or bundling is a well known effect, which is mainly ascribed to structural or material dependent properties. However, there have also been recent reports of electron beam induced nanowire bending by SEM imaging, which is not fully e...

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Veröffentlicht in:	Journal of applied physics 2016-04, Vol.119 (14)
Hauptverfasser:	Bitzer, Lucas A., Speich, Claudia, Schäfer, David, Erni, Daniel, Prost, Werner, Tegude, Franz J., Benson, Niels, Schmechel, Roland
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Attraction BENDING CAPACITORS CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS COMPUTERIZED SIMULATION CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY Dynamic models ELECTRON BEAMS Electron microscopes ELECTRONS GALLIUM ARSENIDES LORENTZ FORCE NANOWIRES Parameters SCANNING ELECTRON MICROSCOPY WIRES
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