Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

In this manuscript, we describe how the map of high frequency conductivity distribution of an oxide-doped anti-ferromagnetic 200 nm thin film can be obtained from the quality factor (Q) measured by a near-field scanning microwave microscope (NSMM). Finite element analysis (FEA) is employed to simula...

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Veröffentlicht in:	AIP advances 2014-04, Vol.4 (4), p.047114-047114-9
Hauptverfasser:	Wu, Z., Souza, A. D., Peng, B., Sun, W. Q., Xu, S. Y., Ong, C. K.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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