Anisotropic electrical properties in bismuth layer structured dielectrics with natural super lattice structure

Dielectric property of epitaxial SrBi4Ti4O15 thin films with (001)-, (1110)-, (105)/(015)-, and (100)/(010)-orientations was investigated as a function of film thickness. As the tilting angle of c-axis from the surface normal is smaller, the relative dielectric constant begins to degrade at thinner...

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Veröffentlicht in:	Applied physics letters 2012-07, Vol.101 (1)
Hauptverfasser:	Kojima, Takashi, Kimura, Junichi, Suzuki, Muneyasu, Takahashi, Kenji, Oikawa, Takahiro, Sakashita, Yukio, Kato, Kazumi, Watanabe, Takayuki, Takenaka, Tadashi, Yamada, Tomoaki, Funakubo, Hiroshi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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