Contact stiffness of layered materials for ultrasonic atomic force microscopy

A method to calculate the contact stiffness between a layered material and an ultrasonic atomic force microscope (UAFM) tip is proposed. The radiation impedance method is used to determine the ratio of the applied force to the average displacement within the contact area. This information is used in...

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Veröffentlicht in:	Journal of applied physics 2000-05, Vol.87 (10), p.7491-7496
Hauptverfasser:	Yaralioglu, G. G., Degertekin, F. L., Crozier, K. B., Quate, C. F.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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