Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure

Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure

The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 1998-06, Vol.83 (11), p.6810-6812
Hauptverfasser: Krishnan, Kannan M., Nelson, C., Echer, C. J., Farrow, R. F. C., Marks, R. F., Kellock, A. J.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 6812
container_issue 11
container_start_page 6810
container_title Journal of applied physics
container_volume 83
creator Krishnan, Kannan M.
Nelson, C.
Echer, C. J.
Farrow, R. F. C.
Marks, R. F.
Kellock, A. J.
description The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42
doi_str_mv 10.1063/1.367815
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_367815</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_367815</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-4dbddb494b84ace085d30166bd20aa6138adc2603205027d0f1c83c4bdacbe7e3</originalsourceid><addsrcrecordid>eNotkMtKxDAYRoMoWEfBR8jSTcf_T3pJ3ckwXmBEEV24Krl1jLTNkHSgfQPXPqJPImVcnc3H-eAQcomwRCj4NS55UQrMj0iCIKq0zHM4JgkAw1RUZXVKzmL8AkAUvErIx3rUn7LfWqqcjK7fUt_QnQ2dbFs_0ca1XaRqok_9-DLg7_fPeENffWvnmfbdzkc3ON9T2RvaOR18HMJeD_tgz8lJI9toL_65IO9367fVQ7p5vn9c3W5SzSoc0swoY1RWZUpkUlsQueGARaEMAykL5EIazQrgDHJgpYEGteA6U0ZqZUvLF-Tq4J3PY7BNvQuuk2GqEeo5SY31IQn_A3mHVWk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure</title><source>AIP Digital Archive</source><creator>Krishnan, Kannan M. ; Nelson, C. ; Echer, C. J. ; Farrow, R. F. C. ; Marks, R. F. ; Kellock, A. J.</creator><creatorcontrib>Krishnan, Kannan M. ; Nelson, C. ; Echer, C. J. ; Farrow, R. F. C. ; Marks, R. F. ; Kellock, A. J.</creatorcontrib><description>The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42&lt;x&lt;0.76 and t∼350 Å. Δσ exhibits a sharp peak of 0.1 erg/cm2 at 51% Mn. We compare the magnetic and microstructural properties of two bilayer films, which have the same compositions of permalloy and MnxPt1−x: [Ni0.85Fe0.15(100 Å)/Mn0.49Pt0.51(t Å)]. In one case (normal structure), the epitaxial permalloy was grown first onto Pt/MgO(001), followed by 170 Å of Mn0.49Pt0.51. In the other structure (inverted), a 350 Å thick polycrystalline film of Mn0.49Pt0.51 was grown onto a SiO2 substrate, followed by permalloy. The structures exhibited very different exchange bias fields (32 versus 86 Oe) and Δσ values (0.021 versus 0.060 erg/cm2), respectively. Significant differences in texture, grain size, and Mn0.49Pt0.51 layer thickness for the two samples are reported.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.367815</identifier><language>eng</language><ispartof>Journal of applied physics, 1998-06, Vol.83 (11), p.6810-6812</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-4dbddb494b84ace085d30166bd20aa6138adc2603205027d0f1c83c4bdacbe7e3</citedby><cites>FETCH-LOGICAL-c291t-4dbddb494b84ace085d30166bd20aa6138adc2603205027d0f1c83c4bdacbe7e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Krishnan, Kannan M.</creatorcontrib><creatorcontrib>Nelson, C.</creatorcontrib><creatorcontrib>Echer, C. J.</creatorcontrib><creatorcontrib>Farrow, R. F. C.</creatorcontrib><creatorcontrib>Marks, R. F.</creatorcontrib><creatorcontrib>Kellock, A. J.</creatorcontrib><title>Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure</title><title>Journal of applied physics</title><description>The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42&lt;x&lt;0.76 and t∼350 Å. Δσ exhibits a sharp peak of 0.1 erg/cm2 at 51% Mn. We compare the magnetic and microstructural properties of two bilayer films, which have the same compositions of permalloy and MnxPt1−x: [Ni0.85Fe0.15(100 Å)/Mn0.49Pt0.51(t Å)]. In one case (normal structure), the epitaxial permalloy was grown first onto Pt/MgO(001), followed by 170 Å of Mn0.49Pt0.51. In the other structure (inverted), a 350 Å thick polycrystalline film of Mn0.49Pt0.51 was grown onto a SiO2 substrate, followed by permalloy. The structures exhibited very different exchange bias fields (32 versus 86 Oe) and Δσ values (0.021 versus 0.060 erg/cm2), respectively. Significant differences in texture, grain size, and Mn0.49Pt0.51 layer thickness for the two samples are reported.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNotkMtKxDAYRoMoWEfBR8jSTcf_T3pJ3ckwXmBEEV24Krl1jLTNkHSgfQPXPqJPImVcnc3H-eAQcomwRCj4NS55UQrMj0iCIKq0zHM4JgkAw1RUZXVKzmL8AkAUvErIx3rUn7LfWqqcjK7fUt_QnQ2dbFs_0ca1XaRqok_9-DLg7_fPeENffWvnmfbdzkc3ON9T2RvaOR18HMJeD_tgz8lJI9toL_65IO9367fVQ7p5vn9c3W5SzSoc0swoY1RWZUpkUlsQueGARaEMAykL5EIazQrgDHJgpYEGteA6U0ZqZUvLF-Tq4J3PY7BNvQuuk2GqEeo5SY31IQn_A3mHVWk</recordid><startdate>19980601</startdate><enddate>19980601</enddate><creator>Krishnan, Kannan M.</creator><creator>Nelson, C.</creator><creator>Echer, C. J.</creator><creator>Farrow, R. F. C.</creator><creator>Marks, R. F.</creator><creator>Kellock, A. J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19980601</creationdate><title>Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure</title><author>Krishnan, Kannan M. ; Nelson, C. ; Echer, C. J. ; Farrow, R. F. C. ; Marks, R. F. ; Kellock, A. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-4dbddb494b84ace085d30166bd20aa6138adc2603205027d0f1c83c4bdacbe7e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Krishnan, Kannan M.</creatorcontrib><creatorcontrib>Nelson, C.</creatorcontrib><creatorcontrib>Echer, C. J.</creatorcontrib><creatorcontrib>Farrow, R. F. C.</creatorcontrib><creatorcontrib>Marks, R. F.</creatorcontrib><creatorcontrib>Kellock, A. J.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Krishnan, Kannan M.</au><au>Nelson, C.</au><au>Echer, C. J.</au><au>Farrow, R. F. C.</au><au>Marks, R. F.</au><au>Kellock, A. J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure</atitle><jtitle>Journal of applied physics</jtitle><date>1998-06-01</date><risdate>1998</risdate><volume>83</volume><issue>11</issue><spage>6810</spage><epage>6812</epage><pages>6810-6812</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>The interfacial coupling energy, Δσ for polycrystalline Ni0.8Fe0.2 (100 Å)/MnxPt1−x (t Å)/SiO2 bilayers, has been determined from wedge samples spanning a MnxPt1−x composition range 0.42&lt;x&lt;0.76 and t∼350 Å. Δσ exhibits a sharp peak of 0.1 erg/cm2 at 51% Mn. We compare the magnetic and microstructural properties of two bilayer films, which have the same compositions of permalloy and MnxPt1−x: [Ni0.85Fe0.15(100 Å)/Mn0.49Pt0.51(t Å)]. In one case (normal structure), the epitaxial permalloy was grown first onto Pt/MgO(001), followed by 170 Å of Mn0.49Pt0.51. In the other structure (inverted), a 350 Å thick polycrystalline film of Mn0.49Pt0.51 was grown onto a SiO2 substrate, followed by permalloy. The structures exhibited very different exchange bias fields (32 versus 86 Oe) and Δσ values (0.021 versus 0.060 erg/cm2), respectively. Significant differences in texture, grain size, and Mn0.49Pt0.51 layer thickness for the two samples are reported.</abstract><doi>10.1063/1.367815</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0021-8979
ispartof Journal of applied physics, 1998-06, Vol.83 (11), p.6810-6812
issn 0021-8979
1089-7550
language eng
recordid cdi_crossref_primary_10_1063_1_367815
source AIP Digital Archive
title Exchange biasing of permalloy films by MnxPt1−x: Role of composition and microstructure
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T03%3A07%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Exchange%20biasing%20of%20permalloy%20films%20by%20MnxPt1%E2%88%92x:%20Role%20of%20composition%20and%20microstructure&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Krishnan,%20Kannan%20M.&rft.date=1998-06-01&rft.volume=83&rft.issue=11&rft.spage=6810&rft.epage=6812&rft.pages=6810-6812&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.367815&rft_dat=%3Ccrossref%3E10_1063_1_367815%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true