$High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayers$

High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayers

The surface and interface structures of ZnTe epilayers grown by molecular beam epitaxy on GaSb (001) substrates under different conditions have been investigated by high resolution x-ray diffraction and grazing incidence scattering. Reciprocal space mapping around the symmetrical diffraction recipro...

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Veröffentlicht in:	Journal of applied physics 1997-09, Vol.82 (5), p.2281-2287
Hauptverfasser:	Li, C. R., Tanner, B. K., Ashenford, D. E., Hogg, J. H. C., Lunn, B.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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