$Refractive index measurements of MgZnCdSe II–VI compound semiconductors grown on InP substrates and fabrications of 500–600 nm range MgZnCdSe distributed Bragg reflectors$

Refractive index measurements of MgZnCdSe II–VI compound semiconductors grown on InP substrates and fabrications of 500–600 nm range MgZnCdSe distributed Bragg reflectors

Refractive indices of Mgx(Zn0.48Cd0.52)1−xSe compounds grown on InP substrates were systematically investigated as a function of Mg composition (x). The refractive indices with various Mg compositions were estimated from the reflectance measurements. By approximating the refractive indices by the mo...

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Veröffentlicht in:	Journal of applied physics 1997-06, Vol.81 (11), p.7575-7579
Hauptverfasser:	Morita, Toshihiro, Shinbo, Hiroyuki, Nagano, Takeshi, Nomura, Ichirou, Kikuchi, Akihiko, Kishino, Katsumi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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