Structure and magnetoresistive properties in La–manganite thin films
This study investigates the structure of perovskite thin films and its influence on their colossal magnetoresistance (CMR) properties. Epitaxial thin films of perovskite manganites La1−xBxMnO3−δ (B=Ca,Sr) were prepared on SrTiO3 (100) substrates using on- and off-axis pulsed laser deposition (PLD) t...
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| Veröffentlicht in: | Journal of Applied Physics 1997-04, Vol.81 (8), p.5496-5498 |
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| container_end_page | 5498 |
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| container_issue | 8 |
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| container_title | Journal of Applied Physics |
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| creator | Gommert, E. Cerva, H. Rucki, A. Helmolt, R. v. Wecker, J. Kuhrt, C. Samwer, K. |
| description | This study investigates the structure of perovskite thin films and its influence on their colossal magnetoresistance (CMR) properties. Epitaxial thin films of perovskite manganites La1−xBxMnO3−δ (B=Ca,Sr) were prepared on SrTiO3 (100) substrates using on- and off-axis pulsed laser deposition (PLD) techniques. X-ray diffraction, resistance and magnetoresistance measurements, as well as high-resolution transmission electron microscopy (HRTEM) investigations were carried out. HRTEM observations reveal epitaxial growth for the first few layers of all prepared samples. Thicker on-axis prepared films grow with a large number of defects, whereas off-axis prepared samples grow in a columnar structure. Since the magnetic properties in systems with double-exchange interaction are very sensitive to the local structure it has great influence on the electronic properties. |
| doi_str_mv | 10.1063/1.364579 |
| format | Article |
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Epitaxial thin films of perovskite manganites La1−xBxMnO3−δ (B=Ca,Sr) were prepared on SrTiO3 (100) substrates using on- and off-axis pulsed laser deposition (PLD) techniques. X-ray diffraction, resistance and magnetoresistance measurements, as well as high-resolution transmission electron microscopy (HRTEM) investigations were carried out. HRTEM observations reveal epitaxial growth for the first few layers of all prepared samples. Thicker on-axis prepared films grow with a large number of defects, whereas off-axis prepared samples grow in a columnar structure. Since the magnetic properties in systems with double-exchange interaction are very sensitive to the local structure it has great influence on the electronic properties.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.364579</identifier><language>eng</language><publisher>United States</publisher><subject>CALCIUM COMPOUNDS ; CALCIUM OXIDES ; CRYSTAL STRUCTURE ; ELECTRIC CONDUCTIVITY ; LANTHANUM COMPOUNDS ; LANTHANUM OXIDES ; MAGNETORESISTANCE ; MANGANESE OXIDES ; MATERIALS SCIENCE ; PEROVSKITES ; STRONTIUM COMPOUNDS ; STRONTIUM OXIDES ; THIN FILMS ; TRANSMISSION ELECTRON MICROSCOPY ; X-RAY DIFFRACTION</subject><ispartof>Journal of Applied Physics, 1997-04, Vol.81 (8), p.5496-5498</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c317t-8a07f85d8d74d1d22beafb3680c8b701e9ae25971741a8e8e65c1add9e4ab8373</citedby><cites>FETCH-LOGICAL-c317t-8a07f85d8d74d1d22beafb3680c8b701e9ae25971741a8e8e65c1add9e4ab8373</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,881,27903,27904</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/496599$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Gommert, E.</creatorcontrib><creatorcontrib>Cerva, H.</creatorcontrib><creatorcontrib>Rucki, A.</creatorcontrib><creatorcontrib>Helmolt, R. v.</creatorcontrib><creatorcontrib>Wecker, J.</creatorcontrib><creatorcontrib>Kuhrt, C.</creatorcontrib><creatorcontrib>Samwer, K.</creatorcontrib><title>Structure and magnetoresistive properties in La–manganite thin films</title><title>Journal of Applied Physics</title><description>This study investigates the structure of perovskite thin films and its influence on their colossal magnetoresistance (CMR) properties. Epitaxial thin films of perovskite manganites La1−xBxMnO3−δ (B=Ca,Sr) were prepared on SrTiO3 (100) substrates using on- and off-axis pulsed laser deposition (PLD) techniques. X-ray diffraction, resistance and magnetoresistance measurements, as well as high-resolution transmission electron microscopy (HRTEM) investigations were carried out. HRTEM observations reveal epitaxial growth for the first few layers of all prepared samples. Thicker on-axis prepared films grow with a large number of defects, whereas off-axis prepared samples grow in a columnar structure. Since the magnetic properties in systems with double-exchange interaction are very sensitive to the local structure it has great influence on the electronic properties.</description><subject>CALCIUM COMPOUNDS</subject><subject>CALCIUM OXIDES</subject><subject>CRYSTAL STRUCTURE</subject><subject>ELECTRIC CONDUCTIVITY</subject><subject>LANTHANUM COMPOUNDS</subject><subject>LANTHANUM OXIDES</subject><subject>MAGNETORESISTANCE</subject><subject>MANGANESE OXIDES</subject><subject>MATERIALS SCIENCE</subject><subject>PEROVSKITES</subject><subject>STRONTIUM COMPOUNDS</subject><subject>STRONTIUM OXIDES</subject><subject>THIN FILMS</subject><subject>TRANSMISSION ELECTRON MICROSCOPY</subject><subject>X-RAY DIFFRACTION</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNotkMFKAzEURYMoWKvgJ4w7N1PzJpNJspRiqzDgQl2HTPKmjXQyJUkFd_6Df-iXOFJXFy6Xy-EQcg10AbRhd7BgTc2FOiEzoFKVgnN6SmaUVlBKJdQ5uUjpnVIAydSMrF5yPNh8iFiY4IrBbALmMWLyKfsPLPZx3GPMHlPhQ9Gan6_vwYSNCT5jkbdT1_vdkC7JWW92Ca_-c07eVg-vy8eyfV4_Le_b0jIQuZSGil5yJ52oHbiq6tD0HWsktbITFFAZrLgSIGowEiU23IJxTmFtOskEm5Ob4-844elkJwq7tWMIaLOuVcOVmja3x42NY0oRe72PfjDxUwPVf4406KMj9gsUZVqH</recordid><startdate>19970415</startdate><enddate>19970415</enddate><creator>Gommert, E.</creator><creator>Cerva, H.</creator><creator>Rucki, A.</creator><creator>Helmolt, R. v.</creator><creator>Wecker, J.</creator><creator>Kuhrt, C.</creator><creator>Samwer, K.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19970415</creationdate><title>Structure and magnetoresistive properties in La–manganite thin films</title><author>Gommert, E. ; Cerva, H. ; Rucki, A. ; Helmolt, R. v. ; Wecker, J. ; Kuhrt, C. ; Samwer, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c317t-8a07f85d8d74d1d22beafb3680c8b701e9ae25971741a8e8e65c1add9e4ab8373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>CALCIUM COMPOUNDS</topic><topic>CALCIUM OXIDES</topic><topic>CRYSTAL STRUCTURE</topic><topic>ELECTRIC CONDUCTIVITY</topic><topic>LANTHANUM COMPOUNDS</topic><topic>LANTHANUM OXIDES</topic><topic>MAGNETORESISTANCE</topic><topic>MANGANESE OXIDES</topic><topic>MATERIALS SCIENCE</topic><topic>PEROVSKITES</topic><topic>STRONTIUM COMPOUNDS</topic><topic>STRONTIUM OXIDES</topic><topic>THIN FILMS</topic><topic>TRANSMISSION ELECTRON MICROSCOPY</topic><topic>X-RAY DIFFRACTION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gommert, E.</creatorcontrib><creatorcontrib>Cerva, H.</creatorcontrib><creatorcontrib>Rucki, A.</creatorcontrib><creatorcontrib>Helmolt, R. v.</creatorcontrib><creatorcontrib>Wecker, J.</creatorcontrib><creatorcontrib>Kuhrt, C.</creatorcontrib><creatorcontrib>Samwer, K.</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gommert, E.</au><au>Cerva, H.</au><au>Rucki, A.</au><au>Helmolt, R. v.</au><au>Wecker, J.</au><au>Kuhrt, C.</au><au>Samwer, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structure and magnetoresistive properties in La–manganite thin films</atitle><jtitle>Journal of Applied Physics</jtitle><date>1997-04-15</date><risdate>1997</risdate><volume>81</volume><issue>8</issue><spage>5496</spage><epage>5498</epage><pages>5496-5498</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>This study investigates the structure of perovskite thin films and its influence on their colossal magnetoresistance (CMR) properties. 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| ispartof | Journal of Applied Physics, 1997-04, Vol.81 (8), p.5496-5498 |
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| language | eng |
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| source | AIP Digital Archive |
| subjects | CALCIUM COMPOUNDS CALCIUM OXIDES CRYSTAL STRUCTURE ELECTRIC CONDUCTIVITY LANTHANUM COMPOUNDS LANTHANUM OXIDES MAGNETORESISTANCE MANGANESE OXIDES MATERIALS SCIENCE PEROVSKITES STRONTIUM COMPOUNDS STRONTIUM OXIDES THIN FILMS TRANSMISSION ELECTRON MICROSCOPY X-RAY DIFFRACTION |
| title | Structure and magnetoresistive properties in La–manganite thin films |
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