Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures

This report summarizes observations of Ge island formation during growth on Si(001) by chemical vapor deposition from germane in the pressure range from 10 Torr to atmospheric pressure in a conventional epitaxial reactor. A four-step growth process is observed: (1) uniform pseudomorphic overlayer (“...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 1997-01, Vol.81 (1), p.211-219
Hauptverfasser: Kamins, T. I., Carr, E. C., Williams, R. S., Rosner, S. J.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 219
container_issue 1
container_start_page 211
container_title Journal of applied physics
container_volume 81
creator Kamins, T. I.
Carr, E. C.
Williams, R. S.
Rosner, S. J.
description This report summarizes observations of Ge island formation during growth on Si(001) by chemical vapor deposition from germane in the pressure range from 10 Torr to atmospheric pressure in a conventional epitaxial reactor. A four-step growth process is observed: (1) uniform pseudomorphic overlayer (“wetting’’ layer) formation; (2) three-dimensional island growth with a constant aspect ratio; (3) continued island growth with a constant diameter and increasing height; (4) rapid growth of larger, faceted islands. Ostwald ripening of the islands during continued heat treatment after terminating the deposition is slow compared to island formation and growth during deposition for the experimental conditions used.
doi_str_mv 10.1063/1.364084
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_364084</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_364084</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-962d5d42002dfe244998028d5ec04c5eab81a22074b15d4726b23ce531052c543</originalsourceid><addsrcrecordid>eNpFkE9LAzEQxYMoWKvgR8ixHrZO_u0mR6m2CgUP6nnJJrNspNtdkq3Sb2-kgjDMwPB7j8cj5JbBkkEp7tlSlBK0PCMzBtoUlVJwTmYAnBXaVOaSXKX0CcCYFmZGvh9xHFKYwrCnQ0unLiIWPvS4T_lld3SDNKSd3ftEM_IWFll6R5sjdR32wWXiy45DpP7fx055-iGNHcbgaNbSiP7g0NMxYkqHvK7JRWt3CW_-7px8rJ_eV8_F9nXzsnrYFo4bNhWm5F55yXN83yKX0hgNXHuFDqRTaBvNLOdQyYZlruJlw4VDJRgo7pQUc7I4-bo4pBSxrccYehuPNYP6t7Ca1afCxA_wYV1W</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures</title><source>AIP Digital Archive</source><creator>Kamins, T. I. ; Carr, E. C. ; Williams, R. S. ; Rosner, S. J.</creator><creatorcontrib>Kamins, T. I. ; Carr, E. C. ; Williams, R. S. ; Rosner, S. J.</creatorcontrib><description>This report summarizes observations of Ge island formation during growth on Si(001) by chemical vapor deposition from germane in the pressure range from 10 Torr to atmospheric pressure in a conventional epitaxial reactor. A four-step growth process is observed: (1) uniform pseudomorphic overlayer (“wetting’’ layer) formation; (2) three-dimensional island growth with a constant aspect ratio; (3) continued island growth with a constant diameter and increasing height; (4) rapid growth of larger, faceted islands. Ostwald ripening of the islands during continued heat treatment after terminating the deposition is slow compared to island formation and growth during deposition for the experimental conditions used.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.364084</identifier><language>eng</language><ispartof>Journal of applied physics, 1997-01, Vol.81 (1), p.211-219</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-962d5d42002dfe244998028d5ec04c5eab81a22074b15d4726b23ce531052c543</citedby><cites>FETCH-LOGICAL-c291t-962d5d42002dfe244998028d5ec04c5eab81a22074b15d4726b23ce531052c543</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Kamins, T. I.</creatorcontrib><creatorcontrib>Carr, E. C.</creatorcontrib><creatorcontrib>Williams, R. S.</creatorcontrib><creatorcontrib>Rosner, S. J.</creatorcontrib><title>Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures</title><title>Journal of applied physics</title><description>This report summarizes observations of Ge island formation during growth on Si(001) by chemical vapor deposition from germane in the pressure range from 10 Torr to atmospheric pressure in a conventional epitaxial reactor. A four-step growth process is observed: (1) uniform pseudomorphic overlayer (“wetting’’ layer) formation; (2) three-dimensional island growth with a constant aspect ratio; (3) continued island growth with a constant diameter and increasing height; (4) rapid growth of larger, faceted islands. Ostwald ripening of the islands during continued heat treatment after terminating the deposition is slow compared to island formation and growth during deposition for the experimental conditions used.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNpFkE9LAzEQxYMoWKvgR8ixHrZO_u0mR6m2CgUP6nnJJrNspNtdkq3Sb2-kgjDMwPB7j8cj5JbBkkEp7tlSlBK0PCMzBtoUlVJwTmYAnBXaVOaSXKX0CcCYFmZGvh9xHFKYwrCnQ0unLiIWPvS4T_lld3SDNKSd3ftEM_IWFll6R5sjdR32wWXiy45DpP7fx055-iGNHcbgaNbSiP7g0NMxYkqHvK7JRWt3CW_-7px8rJ_eV8_F9nXzsnrYFo4bNhWm5F55yXN83yKX0hgNXHuFDqRTaBvNLOdQyYZlruJlw4VDJRgo7pQUc7I4-bo4pBSxrccYehuPNYP6t7Ca1afCxA_wYV1W</recordid><startdate>19970101</startdate><enddate>19970101</enddate><creator>Kamins, T. I.</creator><creator>Carr, E. C.</creator><creator>Williams, R. S.</creator><creator>Rosner, S. J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19970101</creationdate><title>Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures</title><author>Kamins, T. I. ; Carr, E. C. ; Williams, R. S. ; Rosner, S. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-962d5d42002dfe244998028d5ec04c5eab81a22074b15d4726b23ce531052c543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kamins, T. I.</creatorcontrib><creatorcontrib>Carr, E. C.</creatorcontrib><creatorcontrib>Williams, R. S.</creatorcontrib><creatorcontrib>Rosner, S. J.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kamins, T. I.</au><au>Carr, E. C.</au><au>Williams, R. S.</au><au>Rosner, S. J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures</atitle><jtitle>Journal of applied physics</jtitle><date>1997-01-01</date><risdate>1997</risdate><volume>81</volume><issue>1</issue><spage>211</spage><epage>219</epage><pages>211-219</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>This report summarizes observations of Ge island formation during growth on Si(001) by chemical vapor deposition from germane in the pressure range from 10 Torr to atmospheric pressure in a conventional epitaxial reactor. A four-step growth process is observed: (1) uniform pseudomorphic overlayer (“wetting’’ layer) formation; (2) three-dimensional island growth with a constant aspect ratio; (3) continued island growth with a constant diameter and increasing height; (4) rapid growth of larger, faceted islands. Ostwald ripening of the islands during continued heat treatment after terminating the deposition is slow compared to island formation and growth during deposition for the experimental conditions used.</abstract><doi>10.1063/1.364084</doi><tpages>9</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0021-8979
ispartof Journal of applied physics, 1997-01, Vol.81 (1), p.211-219
issn 0021-8979
1089-7550
language eng
recordid cdi_crossref_primary_10_1063_1_364084
source AIP Digital Archive
title Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T11%3A37%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Deposition%20of%20three-dimensional%20Ge%20islands%20on%20Si(001)%20by%20chemical%20vapor%20deposition%20at%20atmospheric%20and%20reduced%20pressures&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Kamins,%20T.%20I.&rft.date=1997-01-01&rft.volume=81&rft.issue=1&rft.spage=211&rft.epage=219&rft.pages=211-219&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.364084&rft_dat=%3Ccrossref%3E10_1063_1_364084%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true